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A new placement algorithm for the optimization of fault tolerant circuits on reconfigurable devices

Published: 05 May 2008 Publication History

Abstract

Reconfigurable logic devices such as SRAM-based Field Programmable Gate Arrays (FPGAs) are nowadays increasingly popular thanks to their capability of implementing complex circuits with very short development time and for their high versatility in implementing different kind of applications, ranging from signal processing to the networking. The usage of reconfigurable devices in safety critical fields such as space or avionics require the adoption of specific fault tolerant techniques, like Triple Modular Redundancy (TMR), in order to protect their functionality against radiation effects. While these techniques allow to increase the protection capability against radiation effects, they introduce several penalties to the design particularly in terms of performances. In this paper, we present an innovative placement algorithm able to implement fault tolerant circuits on SRAM-based FPGAs while reducing the performance penalties. This algorithm is based on a model-based topology heuristic that address the arithmetic modules implemented on the FPGA reducing the interconnection delays between their resources. Experimental evaluations performed by means of timing analysis and fault injection on two industrial-like case studies demonstrated that the proposed algorithm is able to improve the running frequency up to the 44% versus standard TMR-based techniques while maintaining complete fault tolerance capabilities.

References

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[2]
M. Ceschia, A. Paccagnella, S. -- C. Lee, C. Wan, M. Bellato, M. Menichelli, A. Papi, A. Kaminski and J. Wyss "Ion Beam Testing of ALTERA APEX FPGAs", NSREC 2002 Radiation Effects Data Workshop Record, Phoenix, AZ, USA, July 2002.
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Katz, K. LaBel, J.J. Wang, B. Cronquist, R. Koga, S. Penzin and G. Swift, "Radiation effects on current field programmable technologies", IEEE Transactions on Nuclear Science, Vol. 44, Issue 6, Part 1, Dec. 1997, Page (s) : 1945 -- 1956
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Xilinx Application Notes XAPP216, "Correcting Single-Event Upset Through Virtex Partial Reconfiguration", 2000
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Habinc Gaisler Research, "Functional Triple Modular Redundancy (FTMR) VHDL Design Methodology for Redundancy in Combinational and Sequential logic", www.gaisler.com
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K. Samudrala, J. Ramos, S. Katkoori, "Selective Triple Modular Redundancy (STMR) Based Single-Event Upset (SEU) Tolerant Synthesis for FPGAs", IEEE Transactions on Nuclear Science, Vol. 51, No. 5, Oct. 2004.
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Carmichael, "Triple Modular Redundancy Design Techniques for Virtex FPGAs", Xilinx Application Notes XAPP197, 2001.
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Sterpone, M. Violante, S. Rezgui, "An Analysis Based on Fault Injection of Hardening Tecniques for SRAM-based FPGAs", IEEE Transactions on Nuclear Science, Vol. 53, Issue 4, Part 1, August 2006, pp. 2054 -- 2059.
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Sterpone, M. Violante, "A new reliability-oriented place and route algorithm for SRAM-based FPGAs", IEEE Transactions on Computers, Vol. 55, Issue 6, Junes 2006, pp. 732 -- 744.
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Wirthlin, E. Johnson, N. Rollins, M. Caffrey and P. Graham, "The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets", Proceedings of 11th Ann. IEEE Symposium on Field-Programmable Custom Computing Machines, pp. 133 -- 142, 2003.
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Brinkley, A. Carmichael, C. Carmichael, "SEU Mitigation Design Techniques for XQR4000XL", Xilinx Application Notes XAPP181, 2000.
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Lima Kanstensmidt, G. Neuberger, R. Hentschke, L. Carro, and R. Reis,"Designing Fault-Tolerant Techniques for SRAM-based FPGAs", IEEE Design & Test of Computers, Nov-Dec 2004, pp. 552--562.
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"TMRTool User Guide", in Xilinx User Guide UG156, 2004
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Sonza Reorda, L. Sterpone, M. Violante, F. Lima Kastensmidt, L. Carro, "Evaluating different solutions to design fault tolerant systems with SRAM-based FPGAs", The Journal of Electronic Testing: Theory and Applications, Kluwer Academic Publisher, Vol. 23, No. 1, February, 2007, pp. 47 -- 54.

Cited By

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  • (2011)A Novel Design Methodology for Implementing Reliability-Aware Systems on SRAM-Based FPGAsIEEE Transactions on Computers10.1109/TC.2010.28160:12(1744-1758)Online publication date: 1-Dec-2011

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    cover image ACM Conferences
    WREFT '08: Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies
    May 2008
    46 pages
    ISBN:9781605580920
    DOI:10.1145/1366224
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    New York, NY, United States

    Publication History

    Published: 05 May 2008

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    Author Tags

    1. fpga.
    2. placement algorithm
    3. redundancy techniques
    4. reliability
    5. single event upset

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    CF '08: Computing Frontiers Conference
    May 5 - 7, 2008
    Ischia, Italy

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    WREFT '08 Paper Acceptance Rate 5 of 7 submissions, 71%;
    Overall Acceptance Rate 5 of 7 submissions, 71%

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    • (2011)A Novel Design Methodology for Implementing Reliability-Aware Systems on SRAM-Based FPGAsIEEE Transactions on Computers10.1109/TC.2010.28160:12(1744-1758)Online publication date: 1-Dec-2011

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