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Improving architecture testability with patterns

Published: 16 October 2005 Publication History

Abstract

There is a critical need for approaches to support software testing. Our research exploits the information described at Architectural Patterns to drive the definition of tests. As a result, we intend to assist developers in finding relatively shorter and cheaper paths to high dependable software.

References

[1]
A. Bertolino, P. Inverardi, H. Muccini, "An Explorative Journey from Architectural Tests Definition down to Code Execution", Proc. of International Conference on Software Engineering (ICSE), 2001.
[2]
F. Buschmann, R. Meunier, H. Rohnert, P. Sommerlad, M. Stall, Pattern-Oriented Software Architecture, A system of patterns, Wiley & Sons Ltd., 1996.
[3]
J. McGregor, "Test patterns please stand by, Journal of Object-Oriented Programming", 12(3):14--19, 1999.
[4]
R. Coelho, U. Kulesza, A. Staa, C. Lucena, "The Layered Information System Test Pattern", Fifth Latin American Conference on Patterns Languages of Programming (SugarLoafPlop05), 2005.
[5]
D. Riehle, "Composite Design Patterns", Proc. of OOPSLA 1997, p. 218--228, 1997.
[6]
R. V. Binder, "Design for Testability in Object-Oriented Systems", Commun. ACM 37(9): p. 87--101, 1994.

Cited By

View all
  • (2008)Comparing Aspects with Conventional Techniques for Increasing TestabilityProceedings of the 2008 International Conference on Software Testing, Verification, and Validation10.1109/ICST.2008.29(387-395)Online publication date: 9-Apr-2008
  • (2007)Towards design for self-healingFourth international workshop on Software quality assurance: in conjunction with the 6th ESEC/FSE joint meeting10.1145/1295074.1295090(86-89)Online publication date: 3-Sep-2007
  • (2007)Testing High-Reliability Software for Continuous Casting Steel Plants - Experiences and Lessons Learned from Siemens VAIProceedings of the 33rd EUROMICRO Conference on Software Engineering and Advanced Applications10.1109/EUROMICRO.2007.56(255-262)Online publication date: 28-Aug-2007
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Published In

cover image ACM Conferences
OOPSLA '05: Companion to the 20th annual ACM SIGPLAN conference on Object-oriented programming, systems, languages, and applications
October 2005
406 pages
ISBN:1595931937
DOI:10.1145/1094855
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 16 October 2005

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Author Tags

  1. architectural patterns
  2. test patterns
  3. testability

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Cited By

View all
  • (2008)Comparing Aspects with Conventional Techniques for Increasing TestabilityProceedings of the 2008 International Conference on Software Testing, Verification, and Validation10.1109/ICST.2008.29(387-395)Online publication date: 9-Apr-2008
  • (2007)Towards design for self-healingFourth international workshop on Software quality assurance: in conjunction with the 6th ESEC/FSE joint meeting10.1145/1295074.1295090(86-89)Online publication date: 3-Sep-2007
  • (2007)Testing High-Reliability Software for Continuous Casting Steel Plants - Experiences and Lessons Learned from Siemens VAIProceedings of the 33rd EUROMICRO Conference on Software Engineering and Advanced Applications10.1109/EUROMICRO.2007.56(255-262)Online publication date: 28-Aug-2007
  • (2006)Making testing product lines more efficient by improving the testability of product line architecturesProceedings of the ISSTA 2006 workshop on Role of software architecture for testing and analysis10.1145/1147249.1147252(22-27)Online publication date: 17-Jul-2006

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