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Causal probabilistic input dependency learning for switching model in VLSI circuits

Published: 17 April 2005 Publication History

Abstract

Switching model captures the data-driven uncertainty in logic circuits in a comprehensive probabilistic framework. Switching is a critical factor that influences dynamic, active leakage power, coupling noises in CMOS implementations. In this work, we model the input-space by a causal graphical probabilistic model that encapsulates the dependencies in inputs in a compact, minimal fashion and also allows for instantiations of the vector-space that closely match the underlying dependencies, with the constraint that the reduced vector-space captures the dependencies in the larger dataset accu-rately. Results on ISCAS benchmark show that average error is limited to 1.8% while we achieve a compaction ratio of 300.

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URL http://www.hugin.com/

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  • (2011)A trace compression algorithm targeting power estimation of long benchmarksProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132480(702-707)Online publication date: 7-Nov-2011
  • (2011)A trace compression algorithm targeting power estimation of long benchmarksProceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design10.1109/ICCAD.2011.6105406(702-707)Online publication date: 7-Nov-2011
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  1. Causal probabilistic input dependency learning for switching model in VLSI circuits

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    cover image ACM Conferences
    GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI
    April 2005
    518 pages
    ISBN:1595930574
    DOI:10.1145/1057661
    • General Chair:
    • John Lach,
    • Program Chairs:
    • Gang Qu,
    • Yehea Ismail
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 17 April 2005

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    Author Tags

    1. Bayesian networks
    2. cross-talk estimation
    3. power estimation
    4. probabilistic learning
    5. vector compaction

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    GLSVLSI05
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    GLSVLSI05: Great Lakes Symposium on VLSI 2005
    April 17 - 19, 2005
    Illinois, Chicago, USA

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    Overall Acceptance Rate 312 of 1,156 submissions, 27%

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    View all
    • (2011)A trace compression algorithm targeting power estimation of long benchmarksProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132480(702-707)Online publication date: 7-Nov-2011
    • (2011)A trace compression algorithm targeting power estimation of long benchmarksProceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design10.1109/ICCAD.2011.6105406(702-707)Online publication date: 7-Nov-2011
    • (2010)Prediction of area and length complexity measures for binary decision diagramsExpert Systems with Applications: An International Journal10.1016/j.eswa.2009.09.00337:4(2864-2873)Online publication date: 1-Apr-2010
    • (2009)Investigating data preprocessing methods for circuit complexity modelsExpert Systems with Applications: An International Journal10.1016/j.eswa.2007.09.05236:1(519-526)Online publication date: 1-Jan-2009
    • (2008)Applicability of feed-forward and recurrent neural networks to Boolean function complexity modelingExpert Systems with Applications: An International Journal10.1016/j.eswa.2007.04.01034:4(2436-2443)Online publication date: 1-May-2008
    • (2007)A methodology for evaluation time approximation2007 50th Midwest Symposium on Circuits and Systems10.1109/MWSCAS.2007.4488692(776-778)Online publication date: Aug-2007
    • (2007)Binary Decision Diagrams and neural networksThe Journal of Supercomputing10.1007/s11227-006-0010-739:3(301-320)Online publication date: 1-Mar-2007
    • (2006)Binary decision diagramsProceedings of the 6th WSEAS International Conference on Simulation, Modelling and Optimization10.5555/1369472.1369504(179-185)Online publication date: 22-Sep-2006
    • (2006)A Stimulus-Free Probabilistic Model for Single-Event-Upset SensitivityProceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design10.1109/VLSID.2006.26(100-107)Online publication date: 3-Jan-2006
    • (2006)A timing-aware probabilistic model for single-event-upset analysisIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2006.88416514:10(1130-1139)Online publication date: 1-Oct-2006
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