An image quality evaluation tool simulating image sensors including quantum efficiency off-axis effect

24 January 2011 An image quality evaluation tool simulating image sensors including quantum efficiency off-axis effect

Clémence Mornet, Jérôme Vaillant, Thomas Decroux, Nicolas Virollet, Didier Herault, Isabelle Schanen

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Proceedings Volume 7876, Digital Photography VII; 78760M (2011) https://doi.org/10.1117/12.871344
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States

Abstract

The image quality evaluation of CMOS sensors is a big challenge for camera module manufacturers. In this paper, we present an update of the Image Quality Evaluation Tool, a graphical user interface simulating image sensors to assess the performance of a pixel. The simulated images are computed from operating conditions and sensor's characteristics like Quantum Efficiency including off-axis effect. Simulation of QE off-axis impact has been based on characterization data. The method does not require optics, making it suitable for early design phases as for optimizations and investigations. Both measurement and implementation in the tool will be explained. The QE degradation with angle effect will be highlighted on simulated images. A uniform gray scene or coloured image simulation from QE off-axis measurement will help engineers to calculate post-processing digital correction like colour shading correction or colour correction matrix versus pixel position.

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Clémence Mornet, Jérôme Vaillant, Thomas Decroux, Nicolas Virollet, Didier Herault, and Isabelle Schanen "An image quality evaluation tool simulating image sensors including quantum efficiency off-axis effect", Proc. SPIE 7876, Digital Photography VII, 78760M (24 January 2011); https://doi.org/10.1117/12.871344

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