Fast Hough transform analysis: pattern deviation from line segment

8 December 2015 Fast Hough transform analysis: pattern deviation from line segment

E. Ershov, A. Terekhin, D. Nikolaev, V. Postnikov, S. Karpenko

Proceedings Volume 9875, Eighth International Conference on Machine Vision (ICMV 2015); 987509 (2015) https://doi.org/10.1117/12.2228852
Event: Eighth International Conference on Machine Vision, 2015, Barcelona, Spain

Abstract

In this paper, we analyze properties of dyadic patterns. These pattern were proposed to approximate line segments in the fast Hough transform (FHT). Initially, these patterns only had recursive computational scheme. We provide simple closed form expression for calculating point coordinates and their deviation from corresponding ideal lines.

Citation Download Citation

E. Ershov, A. Terekhin, D. Nikolaev, V. Postnikov, and S. Karpenko "Fast Hough transform analysis: pattern deviation from line segment", Proc. SPIE 9875, Eighth International Conference on Machine Vision (ICMV 2015), 987509 (8 December 2015); https://doi.org/10.1117/12.2228852

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