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Journal of Electronic Testing Aims and scope Submit manuscript

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Authors and Affiliations

  1. Asian and Pacific Group Chair, TTTC, IEEE Computer Society, China

    Kozo Kinoshita

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  1. Kozo Kinoshita
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Kinoshita, K. Foreword. Journal of Electronic Testing 18, 13 (2002). https://doi.org/10.1023/A:1013738820917

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  • DOI: https://doi.org/10.1023/A:1013738820917

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