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An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus

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Abstract

This paper describes how to measure a full suite of RF filter characteristics using reusable code to produce a chirp that sweeps the filters’ frequency range. It shows how to measure 3 dB points, bandwidth and group delay of any filter and how accurately the technique correlates to measurements of the silicon performance made in the lab. The test time saving and stability of results are shown as well as the advantages of the technique with regard to having full characterization data available in a production program. Historically test engineers have been asked to characterize certain parts of the device during debug of initial silicon. This adds time pressure to an already time critical sections of product delivery milestone because device characterization on ATE is never part of the original test quotation. This also adds considerable cost pressure since this takes extra software development and tester time to produce. The proposed method can alleviate a part of this problem.

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Authors and Affiliations

  1. ams AG, TobelbaderStrasse 30, 8141, Premstaetten, Austria

    Peter Sarson

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  1. Peter Sarson
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Correspondence to Peter Sarson.

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Responsible Editors: M. J. Barragan and W. R. Eisenstadt

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Sarson, P. An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus. J Electron Test 33, 283–294 (2017). https://doi.org/10.1007/s10836-016-5633-x

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  • DOI: https://doi.org/10.1007/s10836-016-5633-x

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