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Test Technology Technical Council Newsletter

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Journal of Electronic Testing Aims and scope Submit manuscript

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  1. B. Kim
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Kim, B. Test Technology Technical Council Newsletter. J Electron Test 21, 113–114 (2005). https://doi.org/10.1007/s10836-005-6140-7

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  • DOI: https://doi.org/10.1007/s10836-005-6140-7

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