Abstract
Bearings play a crucial role in rotational machines and their failure is one of the foremost causes of breakdowns in rotary machinery. Their functionality is directly relevant to the operational performance, service life and efficiency of these machines. Therefore, bearing fault identification is very significant. The accuracy of fault or anomaly detection by the current techniques is not adequate. We propose a data mining-based framework for fault identification and anomaly detection from machine vibration data. In this framework, to capture the useful knowledge from the vibration data stream (VDS), we first pre-process the data using Fast Fourier Transform (FFT) to extract the frequency signature and then build a compact tree called SAFP-tree (sliding window associated frequency pattern tree), and propose a mining algorithm called SAFP. Our SAFP algorithm can mine associated frequency patterns (i.e., fault frequency signatures) in the current window of VDS and use them to identify faults in the bearing data. Finally, SAFP is further enhanced to SAFP-AD for anomaly detection by determining the normal behavior measure (NBM) from the extracted frequency patterns. The results show that our technique is very efficient in identifying faults and detecting anomalies over VDS and can be used for remote machine health diagnosis.
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Appendix: Abbreviations
Appendix: Abbreviations
VDS Vibration Data Stream
FFT Fast Fourier Transform
SAFP-tree Sliding Window Associated Frequency Pattern Tree
SAFP-AD Sliding Window Associated Frequency Pattern - Anomaly Detection
NBM Normal Behavior Measure
MCM Machine Condition Monitoring
ANN Artificial Neural Network
SVM Support Vector Machine
CPBs Conditional Pattern-Bases
CTs Conditional Trees
AFP Associated Frequency Pattern
SNR Signal-to-Noise Ratio
FPOF Frequent Pattern Outlier Factor
ROC Receiver Operating Characteristics
AUC Area Under the ROC Curve
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Rashid, M.M., Amar, M., Gondal, I. et al. A data mining approach for machine fault diagnosis based on associated frequency patterns. Appl Intell 45, 638–651 (2016). https://doi.org/10.1007/s10489-016-0781-3
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DOI: https://doi.org/10.1007/s10489-016-0781-3