[go: up one dir, main page]
More Web Proxy on the site http://driver.im/ Skip to main content
Log in

Finite element analysis of multi-wire saw silicon rods with consolidated abrasive diamonds

  • ORIGINAL ARTICLE
  • Published:
The International Journal of Advanced Manufacturing Technology Aims and scope Submit manuscript

Abstract

A cutting model is presented in the paper for multi-wire saw silicon rods with consolidated abrasive diamonds. The stress of single diamond particles is analyzed. Besides, the calculation formula of normal and tangential cutting force is found out by formula derivation and calculation. The paper uses ANSYS 15.0 to make finite element analysis for multi-wire saw silicon rods with consolidated abrasive diamonds by loading different process parameters, including wire-line speed and feeding force. Meanwhile, according to removing mechanism of brittle materials, when the maximum cutting depth of single abrasive diamond silicon is less than the critical cutting thickness, the cutting way of multi-wire saw silicon rods is plastic removal. Comparing the deformation by finite element analysis with the maximum cutting depth, the error is not more than 15 %. So the cutting model and calculation of cutting force of multi-wire saw silicon rods with consolidated abrasive diamonds are proven to be basically consistent. The results indicate that when the wire-line speed is constant, with the increase of the feeding force, the maximum cutting depth is also increased, and with the feeding force is constant, with the increase of the wire-line speed, the maximum cutting depth increases first and then decreases. Therefore, considering the maximum cutting depth, setting the wire-line speed to 900 m/min and the feed force to 725 N is the best cutting process parameters.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
£29.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price includes VAT (United Kingdom)

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Möller HJ (2004) Basic mechanisms and models of multi-wire sawing. Adv Eng Mater 6:501–513. doi:10.1002/adem.200400578

    Article  Google Scholar 

  2. Watanabe N, Kondo Y, Ide D, Matsuki T, Takato H, Sakata I (2010) Characterization of polycrystalline silicon wafers for solar cells sliced with novel fixed-abrasive wire. Prog Photovolt Res Appl 18:485–490. doi:10.1002/pip.923

    Article  Google Scholar 

  3. Bidiville A, Wasmer K, Kraft R, Ballif C (2009) Diamond wire-sawn silicon wafers—from the lab to the cell production. In the proc. of the 24th European Photovoltaic Solar Energy Conference and Exhibition (the 24th EU PVSEC), Hamburg, Germany. doi:10.4229/24thEUPVSEC2009-2CV.1.86

  4. Wu H, Melkote SN, Danyluk S (2012) Mechanical strength of silicon wafers cut by loose abrasive slurry and fixed abrasive diamond wire sawing. Adv Eng Mater 14:342–348. doi:10.1002/adem.201100263

    Article  Google Scholar 

  5. Yu X, Wang P, Li X, Yang D (2012) Thin Czochralski silicon solar cells based on diamond wire sawing technology. Sol Energy Mater Sol Cells 98:337–342. doi:10.1016/j.solmat.2011.11.028

    Article  Google Scholar 

  6. Yang C, Wu H, Melkote S, Danyluk S (2013) Comparative analysis of fracture strength of slurry and diamond wire sawn multicrystalline silicon solar wafers. Adv Eng Mater 15:358–365. doi:10.1002/adem.201200262

    Article  Google Scholar 

  7. Yang C, Mess F, Skenes K, Melkote S, Danyluk S (2012) On the residual stress and fracture strength of crystalline silicon wafers. Appl Phys Lett 102:021909. doi:10.1063/1.4776706

    Article  Google Scholar 

  8. Gao Y, Ge P (2011) Analysis of grit cut depth in fixed-abrasive diamond wire saw slicing single crystal silicon. Diffus Defect Data Part B 175:72–76. doi:10.4028/www.scientific.net/SSP.175.72

    Google Scholar 

  9. Wu H, Yang C, Melkote S (2016) Modeling and analysis of the grit level interaction in diamond wire sawing of silicon. Int J Adv Manuf Technol 84:907–913. doi:10.1007/s00170-015-7771-1

    Google Scholar 

  10. Clark WI, Shih AJ, Hardin CW, Lemaster RL, McSpadden SB (2003) Fixed abrasive diamond wire machining-part I:process monitoring and wire tension force. International Journal of Machine Tools and Manufacture, 2003 43(5):523–532. doi:10.1016/S0890-6955(02)00215-8

    Article  Google Scholar 

  11. Clark WI, Shih AJ, Hardin CW, Lemaster RL, McSpadden SB (2003) Fixed abrasive diamond wire machining-part II:experiment design and results. International Journal of Machine Tools and Manufacture, 2003 43(5):533–542. doi:10.1016/S0890-6955(02)00216-X

    Article  Google Scholar 

  12. Sugawara J, Hara H, Mizoguchi A (2004) Development of fixed-abrasive-grain wire saw with less cutting loss. Science Technical Review 58(7):7–10

    Google Scholar 

  13. Li Z, Wang MJ, Pan X, Ni YM (2015) Slicing parameters optimizing and experiments based on constant wire wear loss model in multi-wire saw. Int J Adv Manuf Technol 81:329–334. doi:10.1007/s00170-015-7229-5

    Article  Google Scholar 

  14. Zhao LG, Zuo DW, Sun YL, Wang M (2010) Experimental research on cutting of silicon with fixed diamond wire saw. Key Engineering Material 431-432:25–28. doi:10.4028/www.scientific.net/KEM.431-432.25

    Article  Google Scholar 

  15. Meng JF, Li JF, Ge PQ, Gao W (2004) Removal mechanism in wire-sawing of hard-brittle material. Mater Sci Forum 471-472:192–195 WOS:000225237800039

    Article  Google Scholar 

  16. Meng JF, Li JF, Ge PQ, Zhou R (2005) Research on endless wire saw cutting of Al2O3/TiC ceramics. Key Eng Mater 315-316:571–574 WOS:000239350600117

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Chaohua Wu.

Electronic supplementary material

ESM 1

(PROJECT_CACHE 447 bytes)

ESM 2

(XML 27 kb)

ESM 3

(ENGD 27 kb)

ESM 4

(XML 16 kb)

ESM 5

(XML 849 bytes)

ESM 6

(XML 12 kb)

ESM 7

(DAT 829 kb)

ESM 8

(PCS 2 kb)

ESM 9

(ERR 599 bytes)

ESM 10

(RST 2560 kb)

ESM 11

(OUT 27 kb)

ESM 12

(WBDP 93 kb)

ESM 13

(ENGD 27 kb)

ESM 14

(MECHDB 286 kb)

ESM 15

(WBPJ 142 kb)

ESM 16

(XLS 19 kb)

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Wu, C., Jiang, Z., Fan, W. et al. Finite element analysis of multi-wire saw silicon rods with consolidated abrasive diamonds. Int J Adv Manuf Technol 90, 241–248 (2017). https://doi.org/10.1007/s00170-016-9321-x

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s00170-016-9321-x

Keywords

Navigation