Abstract
An IC test software supporting environment—ICTSSE, which supports the migration and simulation of test pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Development System (TeDS). It has the capabilities of verifying the IC’s stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format, which is the center of the TEDS, is built for test pattern migration.
Similar content being viewed by others
Explore related subjects
Discover the latest articles, news and stories from top researchers in related subjects.References
Marefat M. Object-oriented intelligent computer-integrated design, process planning, and inspection.IEEE Computer, 1993, (3): 54–55.
Proker G. The logic simulator-tester LINK: It’s a two-way street. InProc. Int’l Test Conference, Washington, 1987 pp.254–260.
Perugini M A. A flexible approach to test program cross compilers. InProc. Int’l Test Conf., Washington, 1991, pp.1076–1086.
Ivie J. A high level approach to intergrating design and test. InProc. Int’l Test Conf., Washington, 1988, pp.452–459.
Walter A, Kleinman Y, Edetshteyn L, Gartner J. An expert test program generation system for per-pin testers. InProc. Int’l Test Conf., Washington, 1988, pp.665–668.
Begley R F. Design and test: CAD to CAT.Evaluation Engineering, 1988, 10: 14–18.
Allen R W. DORA2 system for the UNIX operating system. InProc. Int’l Test Conf., Washington, 1987, pp. 392–398.
Ji-en Morris Chang Optimal use of timing resources: A crucial step in test program generation. InProc. Int’l Test Conf., Washington, 1988, pp.460–465.
Sun Yuning, Shi Wanchun. TeIF: A data interchange format in test development system(TeDS). inProc. CAD/Graphics’93, Beijing, 1993, Vol. 2, pp. 638–641.
EDIF Test Technical Subcommittee. EDIF test technical subcommittee test extension Ver.3032. Oct. 1991.
Verhelst B. Using a test specification format in automatic testpprogram generation.IEEE Design & Test of Computer, 1990, (2): 39–45.
Dettloff W D. The Omnitest system: A no-generate, no-compiler interactive test methodology. InProc. Int’l Test Conf., Washington, 1989, pp. 572–576.
Author information
Authors and Affiliations
Additional information
The work is supported by the Eighth-Five National Research Project of China.
Sun Yuning received his B.S. and M.S. degrees in computer engineering from Shandong University of Technology in 1989 and 1991 respectively. He received his Ph.D. degree from Institute of Computing Technology, The Chinese Academy of Sciences in 1994. Now he is a post-doctor in CASE Research Lab in Department of Computer Science and Technology, Peking University. His research interests include object-oriented software engineering, CAT and multimedia.
For the biography ofWang Xiaoming, please see p.297 of Vol.10, No.4.
Shi Wanchun received his B.S. degree from Harbin Instutite of Technology in 1958. He is the Dean of the 12th Lab in Institute of Computing Technology, The Chinese Academy of Sciences.
Rights and permissions
About this article
Cite this article
Sun, Y., Wang, X. & Shi, W. ICTSSE: An object-oriented IC test software supporting environment. J. of Comput. Sci. & Technol. 10, 447–454 (1995). https://doi.org/10.1007/BF02948340
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02948340