Abstract
Issues found in model-based testing of state-based systems are traces produced by the system under test that are not allowed by the model used as specification. It is usually easier to determine the error behind the reported issue when there is a short trace revealing the issue. Our model-based test system treats the system under test as a black box. Hence the test system cannot use internal information from the system under test to find short traces. This paper shows how the model can be used to systematically search for shorter traces producing an issue based on some trace revealing an issue.
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Arts, T., Castro, L.M., Hughes, J.: Testing Erlang data types with Quviq Quickcheck. In: Proceedings of the 7th ACM SIGPLAN Workshop on ERLANG, ERLANG 2008, pp. 1–8. ACM, New York (2008)
Baier, C., Katoen, J.-P.: Principles of Model Checking (Representation and Mind Series). The MIT Press (2008)
Bradley, A.R., Manna, Z.: Property-directed incremental invariant generation. Form. Asp. Comput. 20(4-5), 379–405 (2008)
Claessen, K., Hughes, J.: QuickCheck: a lightweight tool for random testing of Haskell programs. In: Proceedings of the 5th International Conference on Functional Programming, ICFP 2000, Montreal, Canada, pp. 268–279. ACM Press (2000)
Vytiniotis, D., de Azevedo Amorim, A., Lampropoulos, L.: Testing noninterference, quickly. In: Proceedings of the 18th ACM SIGPLAN International Conference on Functional Programming, ICFP 2013, pp. 455–468. ACM, New York (2013)
Hughes, J.: Software testing with quickcheck. In: Horváth, Z., Plasmeijer, R., Zsók, V. (eds.) CEFP 2009. LNCS, vol. 6299, pp. 183–223. Springer, Heidelberg (2010)
Junker, U.: Quickxplain: Conflict detection for arbitrary constraint propagation algorithms. In: IJCAI 2001 Workshop on Modelling and Solving Problems with Constraints (2001)
Koopman, P., Achten, P., Plasmeijer, R.: Model based testing with logical properties versus state machines. In: Gill, A., Hage, J. (eds.) IFL 2011. LNCS, vol. 7257, pp. 116–133. Springer, Heidelberg (2012)
Koopman, P., Plasmeijer, R.: Testing reactive systems with Gast. In: Gilmore, S. (ed.) Proceedings of the 4th Symposium on Trends in Functional Programming, TFP 2003, pp. 111–129. Intellect Books (2004) ISBN 1-84150-122-0
Koopman, P., Plasmeijer, R.: Generic generation of elements of types. In: Proceedings of the 6th Symposium on Trends in Functional Programming, TFP 2005, Tallin, Estonia, September 23-24, pp. 163–178. Intellect Books (2005) ISBN 978-1-84150-176-5
Koopman, P., Plasmeijer, R.: Fully automatic testing with functions as specifications. In: Horváth, Z. (ed.) CEFP 2005. LNCS, vol. 4164, pp. 35–61. Springer, Heidelberg (2006)
Plasmeijer, R., van Eekelen, M.: Clean language report, version 2.1 (2002), http://clean.cs.ru.nl
de Vries, R., Tretmans, J.: On-the-fly conformance testing using SPIN. Software Tools for Technology Transfer, STTT 2(4), 382–393 (2000)
van Weelden, A., Oostdijk, M., Frantzen, L., Koopman, P., Tretmans, J.: On-the-fly formal testing of a smart card applet. In: Sasaki, R., Qing, S., Okamoto, E., Yoshiura, H. (eds.) SEC 2005. IFIP AICT, vol. 181, pp. 564–576. Springer, Boston (2005); Also available as Technical Report NIII-R0428
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Koopman, P., Achten, P., Plasmeijer, R. (2014). Model-Based Shrinking for State-Based Testing. In: McCarthy, J. (eds) Trends in Functional Programming. TFP 2013. Lecture Notes in Computer Science, vol 8322. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45340-3_7
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DOI: https://doi.org/10.1007/978-3-642-45340-3_7
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