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An Experimental Comparison of Dimensionality Reduction for Face Verification Methods

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  • First Online:
Pattern Recognition and Image Analysis (IbPRIA 2003)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2652))

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Abstract

Two different approaches to dimensionality reduction techniques are analysed and evaluated, Locally Linear Embedding and a modification of Nonparametric Discriminant Analysis. Both are considered in order to be used in a face verification problem, as a previous step to nearest neighbor classification. LLE is focused in reducing the dimensionality of the space finding the nonlinear manifold underlying the data, while the goal of NDA is to find the most discriminative linear features of the input data that improve the classification rate (without making any prior assumption on the distribution).

This work is supported by Ministerio de Ciencia y Tecnologia grant TIC2000-0399- C02-01.

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Authors and Affiliations

  1. Computer Vision Center-Dept. Informàtica, Universitat Autònoma de Barcelona, 08193, Bellaterra, Barcelona, Spain

    David Masip & Jordi Vitrià

Authors
  1. David Masip
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  2. Jordi Vitrià
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Editors and Affiliations

  1. Unitat de Gràfics i Visió per Ordinador Departament de Ciències Matemàtiques i Informàtica, Universitat de les Illes Balears Edifici Anselm Turmeda, Ctra. de Valldemossa km 7,5, 07122, Palma de Mallorca, Spain

    Francisco José Perales

  2. FEUP - Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, 4200-465, Porto, Portugal

    Aurélio J. C. Campilho

  3. Departamento de Ciencias da la Computacíon e I.A., Universidad de Granada, E.T. S. Ing. Informática, 18071, Granada, Spain

    Nicolás Pérez de la Blanca

  4. Dept. System Engineering and Automation, Universitat Politècnica de Catalunya (UPC) Barcelona, Spain

    Alberto Sanfeliu

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© 2003 Springer-Verlag Berlin Heidelberg

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Masip, D., Vitrià, J. (2003). An Experimental Comparison of Dimensionality Reduction for Face Verification Methods. In: Perales, F.J., Campilho, A.J.C., de la Blanca, N.P., Sanfeliu, A. (eds) Pattern Recognition and Image Analysis. IbPRIA 2003. Lecture Notes in Computer Science, vol 2652. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44871-6_62

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  • DOI: https://doi.org/10.1007/978-3-540-44871-6_62

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-40217-6

  • Online ISBN: 978-3-540-44871-6

  • eBook Packages: Springer Book Archive

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