Abstract
There are plenty of methods proposed for analog electronic circuit diagnosis, but the most popular ones are the fault dictionary techniques. Admitting more cases in a fault dictionary can be seen as a natural development towards a CBR system. The proposal of this paper is to extend the fault dictionary towards a Case Based Reasoning system. The case base memory, retrieval, reuse, revise and retain tasks are described. Special attention to the learning process is taken. An application example on a biquadratic filter is shown. The faults considered are parametric, permanent, independent and simple, although the methodology could be extrapolated for catastrophic and multiple fault diagnosis. Also, the method is focused and tested only on passive faulty components. Nevertheless, it can be extended to cover active devices as well.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
Chandramouli, R., Pateras, S.: Testing system on a chip. IEEE Spectrum, 42–47 (1996)
Milor, L., Sangiovanni-Vicentelli, A.: Minimizing production test time to detect faults in analog circuits. IEEE Trans. On Computer-Aided Design of IC 13, 796–807 (1994)
Murray, B., Hayes, J.: Testing ICs: Getting to the core of the problem. IEEE Design and Test, 32–38 (1996)
Pang, J., Starzyk, J.: Fault diagnosis in mixed-signal low testability system. International Journal of Circuit Theory and Applications, 487–510 (2002)
Fanni, A., Giua, A., Marchesi, M., Montisci, A.: A neural network diagnosis approach for analog circuits. Applied Intelligence 2, 169–186 (1999)
Fenton, B., McGinnity, M., Maguire, L.: Fault diagnosis of electronic systems using artificial intelligence. IEEE Instrumentation and Measurement, 16–20 (2002)
Sheppard, J.W., Simpson, W.R.: Research Perspectives and Case Studies in Systems Test and Diagnosis, ch. 5. Frontiers in Electronic Testing, vol. 13. Kluwer, Dordrecht (1998) Inducing Inference Models from Case Data.ISBN 0-7923-8263-3
Stenbakken, G., Souders, T., Stewart, G.: Ambiguity groups and testability. IEEE Transactions on Instrumentation and Measurement 38, 941–947 (1989)
Balivada, A., Chen, J., Abraham, J.: Analog testing with time response parameters. IEEE Design and Test of computers, 18–25 (1996)
Lopez de Mantaras, R., Plaza, E.: Case-based reasoning: An overview. AI Communications, 21–29 (1997)
Richter, M.: The knowledge contained in similarity measures. remarks on the invited talk given at ICCBR 1995, Sesimbra, Portugal, October 25 (1995), http://www.cbr-web.org/documents/Richtericcbr95remarks.html
Voorakaranam, R., Chakrabarti, S., Hou, J., Gomes, A., Cherubal, S., Chatterjee, A.: Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis. In: International Test Conference, pp. 903–912 (1997)
Sangiovanni-Vicentelli, A., Chen, L., Chua, L.: An efficient heuristic cluster algorithm for tearing large-scale networks. IEEE Transactions on Circuits and Systems cas-24, 709–717 (1977)
Wilson, D.R., Martinez, T.R.: Improved heterogeneous distance functions. Journal of Artificial Intelligence Research, 1–34 (1997)
Aamodt, A., Plaza, E.: Case-based reasoning: Foundationalu issues, methodological variations and system approaches. AI Communications, 39–59 (1994)
Wilson, D., Martinez, T.: Reduction techniques for instance-based learning algorithms. Machine Learning 38, 257–286 (2000)
Aha, D.W., Kibler, D., Albert, M.: Instance based learning algorithms. Machine Learning 6, 37–66 (1991)
Witten, I.H., Frank, E.: Data Mining. Practical Machine Learning Tools and Techniques with Java Implementations. In: Data Management Systems, Morgan Kaufmann Publishers, San Francisco (2000) ISBN 1-55860-552-5
Kaminska, B., Arabi, K., Goteti, P., Huertas, J., Kim, B., Rueda, A., Soma, M.: Analog and mixed signal benchmark circuits. first release. In: IEEE Mixed Signal Testing Technical Activity Committee ITC 1997, pp. 183–190 (1997)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2004 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Pous, C., Colomer, J., Melendez, J. (2004). Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis. In: Funk, P., González Calero, P.A. (eds) Advances in Case-Based Reasoning. ECCBR 2004. Lecture Notes in Computer Science(), vol 3155. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-28631-8_54
Download citation
DOI: https://doi.org/10.1007/978-3-540-28631-8_54
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-22882-0
Online ISBN: 978-3-540-28631-8
eBook Packages: Springer Book Archive