[go: up one dir, main page]
More Web Proxy on the site http://driver.im/
Skip to main content

Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis

  • Conference paper
Advances in Case-Based Reasoning (ECCBR 2004)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 3155))

Included in the following conference series:

Abstract

There are plenty of methods proposed for analog electronic circuit diagnosis, but the most popular ones are the fault dictionary techniques. Admitting more cases in a fault dictionary can be seen as a natural development towards a CBR system. The proposal of this paper is to extend the fault dictionary towards a Case Based Reasoning system. The case base memory, retrieval, reuse, revise and retain tasks are described. Special attention to the learning process is taken. An application example on a biquadratic filter is shown. The faults considered are parametric, permanent, independent and simple, although the methodology could be extrapolated for catastrophic and multiple fault diagnosis. Also, the method is focused and tested only on passive faulty components. Nevertheless, it can be extended to cover active devices as well.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
£29.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
GBP 19.95
Price includes VAT (United Kingdom)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
GBP 71.50
Price includes VAT (United Kingdom)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
GBP 89.99
Price includes VAT (United Kingdom)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Similar content being viewed by others

References

  1. Chandramouli, R., Pateras, S.: Testing system on a chip. IEEE Spectrum, 42–47 (1996)

    Google Scholar 

  2. Milor, L., Sangiovanni-Vicentelli, A.: Minimizing production test time to detect faults in analog circuits. IEEE Trans. On Computer-Aided Design of IC 13, 796–807 (1994)

    Article  Google Scholar 

  3. Murray, B., Hayes, J.: Testing ICs: Getting to the core of the problem. IEEE Design and Test, 32–38 (1996)

    Google Scholar 

  4. Pang, J., Starzyk, J.: Fault diagnosis in mixed-signal low testability system. International Journal of Circuit Theory and Applications, 487–510 (2002)

    Google Scholar 

  5. Fanni, A., Giua, A., Marchesi, M., Montisci, A.: A neural network diagnosis approach for analog circuits. Applied Intelligence 2, 169–186 (1999)

    Article  Google Scholar 

  6. Fenton, B., McGinnity, M., Maguire, L.: Fault diagnosis of electronic systems using artificial intelligence. IEEE Instrumentation and Measurement, 16–20 (2002)

    Google Scholar 

  7. Sheppard, J.W., Simpson, W.R.: Research Perspectives and Case Studies in Systems Test and Diagnosis, ch. 5. Frontiers in Electronic Testing, vol. 13. Kluwer, Dordrecht (1998) Inducing Inference Models from Case Data.ISBN 0-7923-8263-3

    Google Scholar 

  8. Stenbakken, G., Souders, T., Stewart, G.: Ambiguity groups and testability. IEEE Transactions on Instrumentation and Measurement 38, 941–947 (1989)

    Article  Google Scholar 

  9. Balivada, A., Chen, J., Abraham, J.: Analog testing with time response parameters. IEEE Design and Test of computers, 18–25 (1996)

    Google Scholar 

  10. Lopez de Mantaras, R., Plaza, E.: Case-based reasoning: An overview. AI Communications, 21–29 (1997)

    Google Scholar 

  11. Richter, M.: The knowledge contained in similarity measures. remarks on the invited talk given at ICCBR 1995, Sesimbra, Portugal, October 25 (1995), http://www.cbr-web.org/documents/Richtericcbr95remarks.html

  12. Voorakaranam, R., Chakrabarti, S., Hou, J., Gomes, A., Cherubal, S., Chatterjee, A.: Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis. In: International Test Conference, pp. 903–912 (1997)

    Google Scholar 

  13. Sangiovanni-Vicentelli, A., Chen, L., Chua, L.: An efficient heuristic cluster algorithm for tearing large-scale networks. IEEE Transactions on Circuits and Systems cas-24, 709–717 (1977)

    Article  Google Scholar 

  14. Wilson, D.R., Martinez, T.R.: Improved heterogeneous distance functions. Journal of Artificial Intelligence Research, 1–34 (1997)

    Google Scholar 

  15. Aamodt, A., Plaza, E.: Case-based reasoning: Foundationalu issues, methodological variations and system approaches. AI Communications, 39–59 (1994)

    Google Scholar 

  16. Wilson, D., Martinez, T.: Reduction techniques for instance-based learning algorithms. Machine Learning 38, 257–286 (2000)

    Article  MATH  Google Scholar 

  17. Aha, D.W., Kibler, D., Albert, M.: Instance based learning algorithms. Machine Learning 6, 37–66 (1991)

    Google Scholar 

  18. Witten, I.H., Frank, E.: Data Mining. Practical Machine Learning Tools and Techniques with Java Implementations. In: Data Management Systems, Morgan Kaufmann Publishers, San Francisco (2000) ISBN 1-55860-552-5

    Google Scholar 

  19. Kaminska, B., Arabi, K., Goteti, P., Huertas, J., Kim, B., Rueda, A., Soma, M.: Analog and mixed signal benchmark circuits. first release. In: IEEE Mixed Signal Testing Technical Activity Committee ITC 1997, pp. 183–190 (1997)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2004 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Pous, C., Colomer, J., Melendez, J. (2004). Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis. In: Funk, P., González Calero, P.A. (eds) Advances in Case-Based Reasoning. ECCBR 2004. Lecture Notes in Computer Science(), vol 3155. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-28631-8_54

Download citation

  • DOI: https://doi.org/10.1007/978-3-540-28631-8_54

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-22882-0

  • Online ISBN: 978-3-540-28631-8

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics