Abstract
Learning a distance metric provides solutions to many problems where the data exists in a high dimensional space and hand-crafted distance metrics fail to capture its semantical structure. Methods based on deep neural networks such as Siamese or Triplet networks have been developed for learning such metrics. In this paper we present a metric learning method for sequence data based on a RNN-based triplet network. We posit that this model can be trained efficiently with regards to labels by using Jaccard distance as a proxy distance metric. We empirically demonstrate the performance and efficiency of the approach on three different computer log-line datasets.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Similar content being viewed by others
References
Abadi, M., Barham, P., Chen, J., Chen, Z., Davis, A., Dean, J., Devin, M., Ghemawat, S., Irving, G., Isard, M., et al.: TensorFlow: a system for large-scale machine learning. In: OSDI 2016, pp. 265–283 (2016)
Bromley, J., Guyon, I., LeCun, Y., Säckinger, E., Shah, R.: Signature verification using a “siamese” time delay neural network. In: Advances in Neural Information Processing Systems, pp. 737–744 (1994)
Carlevaris-Bianco, N., Eustice, R.M.: Learning visual feature descriptors for dynamic lighting conditions. In: 2014 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2014), pp. 2769–2776. IEEE (2014)
Chopra, S., Hadsell, R., LeCun, Y.: Learning a similarity metric discriminatively, with application to face verification. In: Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, vol. 1, pp. 539–546 (2005)
Hochreiter, S., Schmidhuber, J.: Long short-term memory. Neural Comput. 9(8), 1735–1780 (1997)
Hoffer, E., Ailon, N.: Deep metric learning using triplet network. In: Feragen, A., Pelillo, M., Loog, M. (eds.) SIMBAD 2015. LNCS, vol. 9370, pp. 84–92. Springer, Cham (2015). https://doi.org/10.1007/978-3-319-24261-3_7
Koch, G., Zemel, R., Salakhutdinov, R.: Siamese neural networks for one-shot image recognition. In: ICML Deep Learning Workshop, vol. 2 (2015)
Melis, G., Dyer, C., Blunsom, P.: On the state of the art of evaluation in neural language models. arXiv preprint arXiv:1707.05589 (2017)
Mueller, J., Thyagarajan, A.: Siamese recurrent architectures for learning sentence similarity. In: AAAI, pp. 2786–2792 (2016)
Neculoiu, P., Versteegh, M., Rotaru, M., Amsterdam, T.B.V.: Learning text similarity with Siamese recurrent networks. ACL 2016, 148 (2016)
Oliner, A.J., Stearley, J.: What supercomputers say : a study of five system logs. In: DSN, pp. 575–584. IEEE (2007)
Pascanu, R., Mikolov, T., Bengio, Y.: On the difficulty of training recurrent neural networks. ICML 3(28), 1310–1318 (2013)
Rippel, O., Paluri, M., Dollar, P., Bourdev, L.: Metric learning with adaptive density discrimination. arXiv preprint arXiv:1511.05939 (2015)
Schroff, F., Kalenichenko, D., Philbin, J.: FaceNet: a unified embedding for face recognition and clustering. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 815–823 (2015)
Socher, R., Ganjoo, M., Manning, C.D., Ng, A.: Zero-shot learning through cross-modal transfer. In: Advances in Neural Information Processing Systems, pp. 935–943 (2013)
Srivastava, N., Hinton, G.E., Krizhevsky, A., Sutskever, I., Salakhutdinov, R.: Dropout: a simple way to prevent neural networks from overfitting. J. Mach. Learn. Res. 15(1), 1929–1958 (2014)
Thaler, S., Menkovski, V., Petkovic, M.: Unsupervised signature extraction from forensic logs. In: Altun, Y., et al. (eds.) ECML PKDD 2017. LNCS (LNAI), vol. 10536, pp. 305–316. Springer, Cham (2017). https://doi.org/10.1007/978-3-319-71273-4_25
Tieleman, T., Hinton, G.: Lecture 6.5-rmsprop: divide the gradient by a running average of its recent magnitude. COURSERA: Neural Netw. Mach. Learn. 4(2), 26–31 (2012)
Wang, J., Song, Y., Leung, T., Rosenberg, C., Wang, J., Philbin, J., Chen, B., Wu, Y.: Learning fine-grained image similarity with deep ranking. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1386–1393 (2014)
Xing, E.P., Jordan, M.I., Russell, S.J., Ng, A.Y.: Distance metric learning with application to clustering with side-information. In: Advances in Neural Information Processing Systems, pp. 521–528 (2003)
Zaremba, W., Sutskever, I., Vinyals, O.: Recurrent neural network regularization. arXiv preprint arXiv:1409.2329 (2014)
Zhou, Z.H.: A brief introduction to weakly supervised learning. Natl. Sci. Rev. 5, 44–53 (2017)
Acknowledgment
The work presented in this paper is part of a project which has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No. 780495.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer International Publishing AG, part of Springer Nature
About this paper
Cite this paper
Thaler, S., Menkovski, V., Petkovic, M. (2018). Deep Metric Learning for Sequential Data Using Approximate Information. In: Perner, P. (eds) Machine Learning and Data Mining in Pattern Recognition. MLDM 2018. Lecture Notes in Computer Science(), vol 10934. Springer, Cham. https://doi.org/10.1007/978-3-319-96136-1_22
Download citation
DOI: https://doi.org/10.1007/978-3-319-96136-1_22
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-96135-4
Online ISBN: 978-3-319-96136-1
eBook Packages: Computer ScienceComputer Science (R0)