Abstract
In this paper, we consider a novel machine learning problem, that is, learning a classifier from noisy label distributions. In this problem, each instance with a feature vector belongs to at least one group. Then, instead of the true label of each instance, we observe the label distribution of the instances associated with a group, where the label distribution is distorted by an unknown noise. Our goals are to (1) estimate the true label of each instance, and (2) learn a classifier that predicts the true label of a new instance. We propose a probabilistic model that considers true label distributions of groups and parameters that represent the noise as hidden variables. The model can be learned based on a variational Bayesian method. In numerical experiments, we show that the proposed model outperforms existing methods in terms of the estimation of the true labels of instances.
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Yoshikawa, Y. (2017). Learning from Noisy Label Distributions. In: Lintas, A., Rovetta, S., Verschure, P., Villa, A. (eds) Artificial Neural Networks and Machine Learning – ICANN 2017. ICANN 2017. Lecture Notes in Computer Science(), vol 10614. Springer, Cham. https://doi.org/10.1007/978-3-319-68612-7_16
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DOI: https://doi.org/10.1007/978-3-319-68612-7_16
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