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Failure Effects Analysis by Multiple Random Variable

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Smart Solutions in Today’s Transport (TST 2017)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 715))

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Abstract

The safety-related systems are typically resisting against dangerous faults. Failure effects on the system can be determined directly by monitoring the original system installation, by simulation of the system operation using its model, or by computing or theoretical reasoning. The process of system ageing can be described with the help of the random failure time. If the system contains \( n \) elements, generally, the ageing process can be characterised as the \( n \)-dimensional random process with time-dependent random variables of the \( n \)-dimensional random vector. The probability density of the failure occurrence of the \( i \)-th system element is represented by the i-th random variable of the random vector. If the analysis of the safety integrity of the safety-related electronic system is used method FTA, that application of knowledge in the field of multiple random variable can greatly simplify the computation of dangerous failure (top event) rate.

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Acknowledgements

This paper has been supported by the Educational Grant Agency of the Slovak Republic (KEGA) Number 034ŽU-4/2016: Implementation of modern technologies focusing on control using the safety PLC into education (50%) and particularly by the project Number: 008ŽU-4/2015: Innovation of HW and SW tools and methods of laboratory education focused on safety aspects of ICT within safety critical applications of processes control (50%).

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Correspondence to Jozef Balák .

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Rástočný, K., Franeková, M., Balák, J. (2017). Failure Effects Analysis by Multiple Random Variable. In: Mikulski, J. (eds) Smart Solutions in Today’s Transport. TST 2017. Communications in Computer and Information Science, vol 715. Springer, Cham. https://doi.org/10.1007/978-3-319-66251-0_34

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  • DOI: https://doi.org/10.1007/978-3-319-66251-0_34

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-66250-3

  • Online ISBN: 978-3-319-66251-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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