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Statistically Characterizing Void Density by Ultrasonic Speckles

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Computer Aided Systems Theory – EUROCAST 2015 (EUROCAST 2015)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 9520))

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Abstract

We investigate the gradual emergence of so–called ultrasonic speckles as a hint to degradation processes deep in the volume of a specimen. These scatterers are caused by the combined action of thermal or electrical loads the specimen is subjected to during overload cycles it might experience as part of normal operation. These scatterers are typically too small to be directly imaged by ultrasound techniques. However, due to their spatial density evolving over time (over load cycles) they expose themselves by gradually forming these revealing US–speckles that increase in contrast over time. We can show that the speckle contrast is a good measure of the average total volume density of scattering voids and thus of the onset and evolution of delaminations via partially developed speckles.

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Acknowlegement

This work has been carried out at LCM GmbH as part of a K2 project. K2 projects are financed using funding from the Austrian COMET K2 programme. The COMET K2 projects at LCM are supported by the Austrian federal government, the federal state of Upper Austria, the Johannes Kepler University and all of the scientific partners which form part of the COMET K2 Consortium. Furthermore the authors gratefully acknowledge the partial financial support of this work by the Austrian Research Promotion Agency under grant 838515.

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Correspondence to Bernhard G. Zagar .

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Sadjina, S., Hölzl, P., Zagar, B.G. (2015). Statistically Characterizing Void Density by Ultrasonic Speckles. In: Moreno-Díaz, R., Pichler, F., Quesada-Arencibia, A. (eds) Computer Aided Systems Theory – EUROCAST 2015. EUROCAST 2015. Lecture Notes in Computer Science(), vol 9520. Springer, Cham. https://doi.org/10.1007/978-3-319-27340-2_80

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  • DOI: https://doi.org/10.1007/978-3-319-27340-2_80

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-27339-6

  • Online ISBN: 978-3-319-27340-2

  • eBook Packages: Computer ScienceComputer Science (R0)

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