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Proving SIFA Protection of Masked Redundant Circuits

  • Conference paper
  • First Online:
Automated Technology for Verification and Analysis (ATVA 2021)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 12971))

Abstract

Implementation attacks like side-channel and fault attacks pose a considerable threat to cryptographic devices that are physically accessible by an attacker. As a consequence, devices like smart cards implement corresponding countermeasures like redundant computation and masking. Recently, statistically ineffective fault attacks (SIFA) were shown to be able to circumvent these classical countermeasure techniques. We present a new approach for verifying the SIFA protection of arbitrary masked implementations in both hardware and software. The proposed method uses Boolean dependency analysis, factorization, and known properties of masked computations to show whether the fault detection mechanism of redundant masked circuits can leak information about the processed secret values. We implemented this new method in a tool called Danira, which can show the SIFA resistance of cryptographic implementations like AES S-Boxes within minutes.

This work was supported by the Austrian Research Promotion Agency (FFG) via the FERMION project (grant number 867542, ICT of the Future), and the K-project DeSSnet (funded in the context of COMET). We refer to the online appendix [22] for the formal proofs of the presented lemmas and theorems.

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Notes

  1. 1.

    Operator \(\triangle \) signifies symmetric difference: \(A \triangle B = (A \cup B) \setminus (A \cap B)\).

  2. 2.

    Danira’s code is available at https://extgit.iaik.tugraz.at/scos/danira.

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Correspondence to Vedad Hadžić .

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Hadžić, V., Primas, R., Bloem, R. (2021). Proving SIFA Protection of Masked Redundant Circuits. In: Hou, Z., Ganesh, V. (eds) Automated Technology for Verification and Analysis. ATVA 2021. Lecture Notes in Computer Science(), vol 12971. Springer, Cham. https://doi.org/10.1007/978-3-030-88885-5_17

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  • DOI: https://doi.org/10.1007/978-3-030-88885-5_17

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