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A Deformable CRF Model for Histopathology Whole-Slide Image Classification

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Medical Image Computing and Computer Assisted Intervention – MICCAI 2020 (MICCAI 2020)

Abstract

To detect abnormality from histopathology images in a patch-based convolutional neural network (CNN), spatial context is an important cue. However, whole-slide image (WSI) is characterized by high morphological heterogeneity in the shape and scale of tissues, hence a simple visual span to a larger context may not well capture the information associated with the central patch or disease of interest. In this paper, we propose a Deformable Conditional Random Field (DCRF) model to learn the offsets and weights of neighboring patches in a spatial-adaptive manner. Additionally, rather than using regularly tessellated or overlapped patches, we localize patches with more powerful feature representations by the adaptively adjusted offsets in a WSI. Both the employment of DCRF for better feature extraction from spatial sampling patches, as well as utilization of the auto-generated patches as training input, can achieve performance improvement in the target task. This model is feasible to the widespread annotation strategies in histopathology images, either with a contoured region of interest (ROI) or patch-wise multi-tissue labels. The proposed model is validated on the patient cohorts from The Cancer Genome Atlas (TCGA) dataset and the Camelyon16 dataset for performance evaluation. The experimental results demonstrate the advantage of the proposed model in the classification task, by the comparison against the baseline models.

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Correspondence to Jing Ke .

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Shen, Y., Ke, J. (2020). A Deformable CRF Model for Histopathology Whole-Slide Image Classification. In: Martel, A.L., et al. Medical Image Computing and Computer Assisted Intervention – MICCAI 2020. MICCAI 2020. Lecture Notes in Computer Science(), vol 12265. Springer, Cham. https://doi.org/10.1007/978-3-030-59722-1_48

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  • DOI: https://doi.org/10.1007/978-3-030-59722-1_48

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-59721-4

  • Online ISBN: 978-3-030-59722-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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