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Automated Generation of Positive and Negative Tests for Parsers

  • Conference paper
Formal Approaches to Software Testing (FATES 2005)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 3997))

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Abstract

In this paper we describe a specification-based approach to automated generation of both positive and negative test sets for parsers. We propose coverage criteria definitions for such test sets and algorithms for generation of the test sets with respect to proposed coverage criteria. We also present practical results of the technique application to testing syntax analyzers of several languages including C and Java.

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© 2006 Springer-Verlag Berlin Heidelberg

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Zelenov, S., Zelenova, S. (2006). Automated Generation of Positive and Negative Tests for Parsers. In: Grieskamp, W., Weise, C. (eds) Formal Approaches to Software Testing. FATES 2005. Lecture Notes in Computer Science, vol 3997. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11759744_13

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  • DOI: https://doi.org/10.1007/11759744_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-34454-4

  • Online ISBN: 978-3-540-34455-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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