Abstract
In this paper we describe a specification-based approach to automated generation of both positive and negative test sets for parsers. We propose coverage criteria definitions for such test sets and algorithms for generation of the test sets with respect to proposed coverage criteria. We also present practical results of the technique application to testing syntax analyzers of several languages including C and Java.
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Aho, A.V., Sethi, R., Ullman, J.D.: Compilers: Principles, Techniques, and Tools. Addison-Wesley, Reading (1986)
Beizer, B.: Software Testing Techniques. van Nostrand Reinhold (1990)
Bourdonov, I.B., Demakov, A.V., Jarov, A.A., Kossatchev, A.S., Kuliamin, V.V., Petrenko, A.K., Zelenov, S.V.: Java Specification Extension for Automated Test Development. In: Bjørner, D., Broy, M., Zamulin, A.V. (eds.) PSI 2001. LNCS, vol. 2244, pp. 301–307. Springer, Heidelberg (2001)
Demakov, A.V., Zelenova, S.A., Zelenov, S.V.: Testing of Parsers of Texts in Formal Languages. Programming Systems and Tools (in Russian) 2, 150–156 (2001)
DeMillo, R.A., Offut, A.J.: Constraint-Based Automatic Test Data Generation. IEEE Transactions on Software Engineering 17(9), 900–910 (1991)
Guilmette, R.F.: TGGS: A flexible system for generating efficient test case generators (1999)
Harm, J., Lämmel, R.: Two-dimensional Approximation Coverage. Informatica Journal 24(3) (2000)
Kossatchev, A.S., Petrenko, A.K., Zelenov, S.V., Zelenova, S.A.: Application of Model-Based Approach for Automated Testing of Optimizing Compilers. In: Proceedings of the International Workshop on Program Understanding, Novosibirsk, pp. 81–88 (2003)
Lämmel, R.: Grammar testing. In: Proc. of Fundamental Approaches Software Engineering, vol. 2029, pp. 201–216 (2001)
Maurer, P.M.: Generating test data with enhanced context-free grammars. IEEE Software, 50–55 (1990)
Maurer, P.M.: The design and implementation of a grammar-based data generator. Software Practice and Experience 22(3), 223–244 (1992)
McKeeman, W.: Differential testing for software. Digital Technical Journal 10(1), 100–107 (1998)
Offut, A.J., Lee, S.D.: An Empirical Evaluation of Weak Mutation. IEEE Transactions on Software Engineering 20(5), 337–344 (1994)
Offut, A.J., Untch, R.H.: Mutation 2000: Uniting the Orthogonal. In: Mutation 2000: Mutation Testing in the Twentieth and the Twenty First Centuries, San Jose, CA, pp. 45–55 (2000)
Petrenko, A.K.: Specification Based Testing: Towards Practice. In: Bjørner, D., Broy, M., Zamulin, A.V. (eds.) PSI 2001. LNCS, vol. 2244, pp. 287–300. Springer, Heidelberg (2001)
Petrenko, A.K., et al.: Compiler Testing Based on the Formal Model of the Language. The Keldysh Institute of Applied Mathematics (in Russian) 45 (1992) (preprint )
Purdom, P.: A Sentence Generator For Testing Parsers. BIT 2, 336–375 (1972)
Zelenov, S.V., Zelenova, S.A., Kossatchev, A.S., Petrenko, A.K.: Test Generation for Compilers and Other Formal Text Processors. Programming and Computer Software 29(3), 104–111 (2003)
GCC, http://gcc.gnu.org/
The mpC Programming Language Specification. The Institute for System Programming of Russian Academy of Science, http://www.ispras.ru/~mpc
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Zelenov, S., Zelenova, S. (2006). Automated Generation of Positive and Negative Tests for Parsers. In: Grieskamp, W., Weise, C. (eds) Formal Approaches to Software Testing. FATES 2005. Lecture Notes in Computer Science, vol 3997. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11759744_13
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DOI: https://doi.org/10.1007/11759744_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-34454-4
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