Accurate modelling of lossy SIW resonators using a neural network residual kriging approach

LETTER

Giovanni Angiulli, Domenico De Carlo, Annalisa Sgró, Mario Versaci, Francesco Carlo Morabito

Author information

Keywords: CAD, artificial neural networks, kriging, lossy SIW resonators

JOURNAL FREE ACCESS

2017 Volume 14 Issue 6 Pages 20170073

DOI https://doi.org/10.1587/elex.14.20170073

Browse “Advance online publication” version

Details

Abstract

In this paper, a computational intelligence method to model lossy substrate integrated waveguide (SIW) cavity resonators, the Neural Network Residual Kriging (NNRK) approach, is presented. Numerical results for the fundamental resonant frequency f_r and related quality factor Q_r computed for the case of lossy hexagonal SIW resonators demonstrate the NNRK superior estimation accuracy compared to that provided by the conventional Artificial Neural Networks (ANNs) models for these devices.

Corresponding author

Register with J-STAGE for free!