An approach based on the analytical expressions of the fringe capacitance for describing the spatial resolution for Position Signal Difference (PSD) electric near-field measurements is addressed in this paper. The calculated full width at half maximum (FWHM) of the measured results by using PSD for the scanning over microstrip line using the proposed model were in good agreement with the measurement results. Furthermore, a new measurement technique for obtaining more accurate results of a normal component of electric near-field by eliminating the fringe capacitance is proposed. The demonstrated results when using the proposed method showed a better correlation to the simulated normal component of electric field than using conventional PSD. Finally, the role of probe displacement for Double Position Signal Difference (DPSD) measurements is also clarified by verifying the measurements using the electromagnetic simulated results.