Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588]

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IEICE Electronics Express

Online ISSN : 1349-2543
ISSN-L : 1349-2543

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Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588]

Haoran Chen, Lin'an Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao

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JOURNAL FREE ACCESS

2013 Volume 10 Issue 24 Pages 20138002

DOI https://doi.org/10.1587/elex.10.20138002

J-STAGE : elex 10 19 pp.20130588-20130588

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© 2013 by The Institute of Electronics, Information and Communication Engineers

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