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IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Influence of trapped flux on critical currents of Josephson junctions
Bjoern Ebert, Torsten Reich, Thomas Ortlepp, Pascal Febvre, F. Hermann Uhlmann
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Keywords: josephson junction, trapped flux, moats, RSFQ
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2008 Volume 5 Issue 11 Pages 431-436

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Abstract
This paper investigates the influence of external field on the distribution of the critical current of Josephson junctions. The external field can cause trapped flux which may reduce the critical current. Experimental results show a formation of bunches in the distribution of the critical current when the external magnetic field rises a certain limit. From a theoretical point of view this formation can only be explained by attractive pinning points in the vicinity of the junction. The Josephson junctions were fabricated with the 1kA/cm2 Nb/Al2O3/Nb trilayer process of FLUXONICS Foundry.
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© 2008 by The Institute of Electronics, Information and Communication Engineers
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