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"1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses."

J. C. Martin et al. (2003)

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DOI: 10.1016/S0026-2714(03)00340-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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J. C. Martin, Cristell Maneux, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin:
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectron. Reliab. 43(9-11): 1725-1730 (2003)

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