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"On the impact of mechanical stress on gate oxide trapping."

Anastasiia Kruv et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129541

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-13

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  dblp key:
  - conf/irps/KruvKGGFLGGW20
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  - https://dblp.org/rec/conf/irps/KruvKGGFLGGW20
Anastasiia Kruv, Ben Kaczer, Alexander Grill, Mario Gonzalez, Jacopo Franco, Dimitri Linten, Wolfgang Goes, Tibor Grasser, Ingrid De Wolf:
On the impact of mechanical stress on gate oxide trapping. IRPS 2020: 1-5

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