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Georg Schitter
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- affiliation: TU Wien, Faculty of Electrical Engineering and Information Technology, Vienna, Austria
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2020 – today
- 2024
- [j42]Jorge Rosano Nonay
, Rene Ruddenklau
Horizontal free-space optical link with CubeISL over 143 km. J. Opt. Commun. Netw. 16(5): 593-601 (2024) - [j41]Rene Ruddenklau
Optimization of acquisition patterns for establishing inter CubeSat optical communications. J. Opt. Commun. Netw. 16(8): 814-821 (2024) - [j40]Denis Ojdanic
Parallel Architecture for Low Latency UAV Detection and Tracking Using Robotic Telescopes. IEEE Trans. Aerosp. Electron. Syst. 60(4): 5515-5524 (2024) - [j39]Alexander Pechhacker
Integrated Electromagnetic Actuator With Adaptable Zero Power Gravity Compensation. IEEE Trans. Ind. Electron. 71(5): 5055-5062 (2024) - [j38]Thomas Hackl
Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy. IEEE Trans. Instrum. Meas. 73: 1-7 (2024) - [j37]Thomas Kern
Laser Triangulation Measurements on Moving Samples With Reduced Lateral Feature Uncertainty. IEEE Trans. Instrum. Meas. 73: 1-8 (2024) - [c69]Daniel Pechgraber, Ernst Csencsics, Georg Schitter:
Reducing the uncertainty in a switched amplifier-driven positioning system to the sub-nanometer level. AIM 2024: 44-50 - [c68]Fabian Reier, Han Woong Yoo, David Brunner, Georg Schitter:
Direct Phase Correction in Phase Locked Loop for Robust Lissajous Scanning of Resonant MEMS Mirrors. AIM 2024: 243-248 - [c67]Bo Cong, Han Woong Yoo, Daniel Pechgraber, Georg Schitter:
Cross-scan Error Evaluation of Large Size Polygon Mirror Based Laser Scanning System for Industrial 3D Printing. AIM 2024: 290-295 - [c66]David Brunner, Han Woong Yoo, Georg Schitter:
Precise Synchronization Control of Parametrically Driven Resonant MEMS Mirrors for Lissajous Scanning with a Fixed Frequency Ratio. AIM 2024: 467-473 - [c65]Christian Haider, Ernst Csencsics, Georg Schitter:
Analyzing the dynamic performance of hybrid reluctance actuators for feedback control. AIM 2024: 657-662 - [c64]Christian Haider, Ernst Csencsics, Georg Schitter:
Frequency-dependency of force dynamics in hybrid reluctance actuators. AIM 2024: 663-667 - [c63]Peter Gsellmann, Tobias Steinegger, Christoph Buchner, Georg Schitter:
EtherCAT-Enabled Depth Camera for Safe Human-Robot Collaboration. AIM 2024: 785-790 - [c62]Benjamin Friedl, Alexander Pechhacker, Ernst Csencsics, Georg Schitter:
Design and Control of a Table-top Vibration Isolation System With Zero-power Gravity Compensation. AIM 2024: 835-840 - [c61]Matthias Laimer, Daniel Wertjanz, Peter Gsellmann, Georg Schitter, Ernst Csencsics:
Enabling feedback position control of an industrial robot based on external sensor signals for dual-stage actuation. AIM 2024: 1252-1257 - [c60]Stefan Hager, Ernst Csencsics, Han Woong Yoo, Georg Schitter:
Reducing the uncertainty of laser straightness measurements via local saturation of imaging sensors. AIM 2024: 1567-1572 - 2023
- [j36]Denis Ojdanic
Feasibility Analysis of Optical UAV Detection Over Long Distances Using Robotic Telescopes. IEEE Trans. Aerosp. Electron. Syst. 59(5): 5148-5157 (2023) - [j35]Ernst Csencsics
Reducing the Speckle-Induced Measurement Uncertainty in Laser Triangulation Sensors. IEEE Trans. Instrum. Meas. 72: 1-9 (2023) - [j34]Thomas Hackl
Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids. IEEE Trans. Instrum. Meas. 72: 1-8 (2023) - [j33]Mathias Poik
Model-Based RF Sensing for Contactless High-Resolution Voltage Measurements. IEEE Trans. Instrum. Meas. 72: 1-8 (2023) - [j32]Daniel Wertjanz
Range Extension for Large-Scale Robotic Precision 3-D Measurements in Vibration-Prone Environments. IEEE Trans. Instrum. Meas. 72: 1-7 (2023) - [c59]Daniel Wertjanz
Feedforward compensation of scan-induced disturbances for a high-precision robotic 3D measurement system. ACC 2023: 679-984 - [c58]Thomas Hackl, Mathias Poik, Georg Schitter:
Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy. I2MTC 2023: 1-5 - [c57]Mathias Poik, Thomas Hackl, Stefano Di Martino, Martin Schober, Jin Dang, Georg Schitter:
Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage Sensing. I2MTC 2023: 1-6 - [c56]Daniel Wertjanz
Robot-based measurement system for double-sided inspection of optical components. I2MTC 2023: 1-6 - [c55]Christoph Buchner, Peter Gsellmann, Martin Melik-Merkumians, Georg Schitter:
Eye-In-Hand Pose Estimation of Industrial Robots. IECON 2023: 1-6 - [c54]Peter Gsellmann, Christoph Buchner, Karin Egretzberger, Martin Melik-Merkumians, Georg Schitter:
Depth-Data-Based Object Cluster Tracking and Velocity Estimation in Robot Workspace. IECON 2023: 1-6 - [c53]Christoph Zech
Sensorless External Torque Sensing for Collision Detection in Collaborative Robots. IECON 2023: 1-6 - 2022
- [j31]Daniel Wertjanz
Three-DoF Vibration Compensation Platform for Robot-Based Precision Inline Measurements on Free-Form Surfaces. IEEE Trans. Ind. Electron. 69(1): 613-621 (2022) - [j30]Han Woong Yoo
Experimental Evaluation of Vibration Influence on a Resonant MEMS Scanning System for Automotive Lidars. IEEE Trans. Ind. Electron. 69(3): 3099-3108 (2022) - [j29]Daniel Wertjanz
Bringing the Lab to the Fab: Robot-Based Inline Measurement System for Precise 3-D Surface Inspection in Vibrational Environments. IEEE Trans. Ind. Electron. 69(10): 10666-10673 (2022) - [j28]Gerhard Stadler, Ernst Csencsics
High Precision Hybrid Reluctance Actuator With Integrated Orientation Independent Zero Power Gravity Compensation. IEEE Trans. Ind. Electron. 69(12): 13296-13304 (2022) - [j27]Christian Haider
Range-Extended Confocal Chromatic Sensor System for Double-Sided Measurement of Optical Components With High Lateral Resolution. IEEE Trans. Instrum. Meas. 71: 1-8 (2022) - [j26]Christopher Naverschnigg
Flexible Robot-Based In-Line Measurement System for High-Precision Optical Surface Inspection. IEEE Trans. Instrum. Meas. 71: 1-9 (2022) - [c52]Christian Schwaer, David Stefanek, Andreas Sinn, Georg Schitter:
Integrated Force Sensor based on Optical Distance Measurement for a Modular Actuator used in Active Optics. AIM 2022: 496-501 - [c51]Johannes Schlarp, Lukas Klemen, Ernst Csencsics, Georg Schitter:
Improving the Repeatability of a Color Sensor by Integrating an FSM for Scanning-based Areal Measurements. AIM 2022: 502-507 - [c50]Peter Gsellmann, Dominik Natter, Georg Schitter:
Collision Avoidance for a SCARA Robot on Construction Sites. AIM 2022: 508-513 - [c49]Bo Cong, Johannes Schlarp, Georg Schitter:
Iterative Learning Control for the Active Error Correction of Polygon Mirror Based Laser Scanning. AIM 2022: 522-527 - [c48]Daniel Wertjanz, Thomas Kern, Alexander Pechhacker, Ernst Csencsics, Georg Schitter:
Robotic precision 3D measurements in vibration-prone environments enabled by active six DoF sample-tracking. AIM 2022: 1441-1446 - [c47]Thomas Hackl
Electrostatic Actuation of AFM Cantilevers in Aqueous Solutions. AIM 2022: 1538-1542 - [c46]Martin Resetarits, Martin Melik-Merkumians, Georg Schitter:
Controlling concurrent events in IEC 61499 based systems on FPGAs. ETFA 2022: 1-4 - [c45]Ernst Csencsics, Johannes Schlarp, Tobias Glaser, Tobias Wolf, Georg Schitter:
Simulation and Reduction of Speckle-induced Uncertainty in Laser Triangulation Sensors. I2MTC 2022: 1-6 - [c44]Thomas Hackl
DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy. I2MTC 2022: 1-5 - [c43]Mathias Poik, Mario Mayr, Thomas Hackl
Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. I2MTC 2022: 1-6 - [c42]Daniel Wertjanz
Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurements. I2MTC 2022: 1-6 - [d2]Han Woong Yoo
Supplementary materials for "Fourier Series based Analytic Model of a Resonant MEMS Mirror for General Voltage Inputs". IEEE DataPort, 2022 - 2021
- [j25]Alois Zoitl, Georg Schitter
Automatisierungs- und Steuerungssysteme in der Produktion. Elektrotech. Informationstechnik 138(6): 307-308 (2021) - [j24]Martin Melik-Merkumians
Modularisierung von Steuerungssoftware. Elektrotech. Informationstechnik 138(6): 309-314 (2021) - [j23]Shingo Ito
Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff. IEEE Trans. Ind. Electron. 68(1): 786-795 (2021) - [j22]David Brunner
Linear Modeling and Control of Comb-Actuated Resonant MEMS Mirror With Nonlinear Dynamics. IEEE Trans. Ind. Electron. 68(4): 3315-3323 (2021) - [j21]Peter Gsellmann
A Novel Approach for Integrating IEC 61131-3 Engineering and Execution Into IEC 61499. IEEE Trans. Ind. Informatics 17(8): 5411-5418 (2021) - [j20]Martin E. Fuerst
Automated Measurement of Highly Divergent Optical Wavefronts With a Scanning Shack-Hartmann Sensor. IEEE Trans. Instrum. Meas. 70: 1-9 (2021) - [j19]Mathias Poik
A Mechatronic Lock-In Amplifier: Integrating Demodulation in Sensor Electronics for Measuring Mechanical Oscillations. IEEE Trans. Instrum. Meas. 70: 1-8 (2021) - [c41]Martin Melik-Merkumians, Peter Gsellmann, Georg Schitter:
Hierarchization and Integration of IEC 61131-3 and IEC 61499 for Enhanced Reusability. ETFA 2021: 1-4 - [c40]Ines Burgstaller, Shingo Ito, Hiroshi Fujimoto, Georg Schitter
Development of Reluctance Actuator for High-Precision Positioning and Scanning Motion. ICM 2021: 1-6 - 2020
- [j18]Shingo Ito
Flux-Controlled Hybrid Reluctance Actuator for High-Precision Scanning Motion. IEEE Trans. Ind. Electron. 67(11): 9593-9600 (2020) - [j17]Johannes Schlarp
Optical Scanning of a Laser Triangulation Sensor for 3-D Imaging. IEEE Trans. Instrum. Meas. 69(6): 3606-3613 (2020) - [c39]Johannes Schlarp
Design of a Mechanical Tunable Resonant Fast Steering Mirror. AIM 2020: 1607-1612 - [c38]Daniel Wertjanz
Design and control of a MAGLEV platform for positioning in arbitrary orientations. AIM 2020: 1935-1942 - [c37]Daniel Wertjanz
An efficient control transition scheme between stabilization and tracking task of a MAGLEV platform enabling active vibration compensation. AIM 2020: 1943-1948 - [c36]Martin E. Fuerst
Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics. I2MTC 2020: 1-6 - [c35]Mathias Poik, Dominik Kohl, Mario Mayr, Christoph Kerschner, Georg Schitter
Efficient Demodulation for Measuring the Amplitude of Mechanical Oscillations. I2MTC 2020: 1-5 - [c34]Johannes Schlarp
Optically scanned laser line sensor. I2MTC 2020: 1-6 - [c33]Naoki Motoi, Mathis Nalbach, Shingo Ito, Philipp J. Thurner, Georg Schitter
Adaptive Control Method Based on Recursive Least Square Method by Piezoelectric Actuator for Pulling Fibril with Parameter Variation. IECON 2020: 550-555 - [d1]David Brunner
Lissajous grid projection and center pixel stability with and without synchronization control. IEEE DataPort, 2020 - [i1]Han Woong Yoo, Rene Riegler, David Brunner, Stephan Albert, Thomas Thurner, Georg Schitter:
Vibration Influence Evaluation of a Resonant MEMS Scanning System for Automotive Lidars. CoRR abs/2010.08327 (2020)
2010 – 2019
- 2019
- [j16]Shingo Ito
Long-Range Fast Nanopositioner Using Nonlinearities of Hybrid Reluctance Actuator for Energy Efficiency. IEEE Trans. Ind. Electron. 66(4): 3051-3059 (2019) - 2018
- [j15]Ernst Csencsics
Hochpräzise roboterbasierte 3D-In-Prozess-Messtechnik. Elektrotech. Informationstechnik 135(6): 382-388 (2018) - [j14]Matthias Bibl, Robert Stein, Egon Döberl, Georg Schitter
Rotierender optischer Positions- und Winkelsensor. Elektrotech. Informationstechnik 135(6): 396-400 (2018) - [j13]Han Woong Yoo, Norbert Druml, David Brunner
MEMS-based lidar for autonomous driving. Elektrotech. Informationstechnik 135(6): 408-415 (2018) - [c32]Mathias Poik, Dominik Kohl, Georg Schitter
Similarity-based Feedback Control for Linear Operation of Piezoelectric Actuators. AIM 2018: 97-102 - [c31]Johannes Schlarp
Feature detection and scan area selection for 3D laser scanning sensors. AIM 2018: 280-285 - [c30]Shingo Ito, Georg Schitter
Optimal fail-safe motion using dynamic brake for Lorentz-actuated AFM. AMC 2018: 473-478 - [c29]Thomas Riel, Andràs Gàlffy, Georg Schitter
Analysis and Robust Control of an Precision Motion Platform Using Disturbance Compensation. CCTA 2018: 1090-1095 - [c28]Peter Gsellmann
Comparison of Code Measures of IEC 61131-3 and 61499 Standards for Typical Automation Applications. ETFA 2018: 1047-1050 - 2017
- [j12]Matthias Wolfgang Hofmair, Martin Melik-Merkumians
Patching process optimization in an agent-controlled timber mill. J. Intell. Manuf. 28(1): 69-84 (2017) - [c27]Dominik Kohl, Christoph Kerschner, Georg Schitter
Automatic fourier synthesis based input-shaping for scanning piezo-electric actuators. AIM 2017: 1083-1088 - [c26]Ernst Csencsics
Bandwidth extension of hybrid-reluctance-force-based tip/tilt system by reduction of eddy currents. AIM 2017: 1167-1172 - [c25]Shingo Ito, Han Woong Yoo, Georg Schitter
Comparison of modeling-free learning control algorithms for galvanometer scanner's periodic motion. AIM 2017: 1357-1362 - [c24]Ernst Csencsics
Design of a phase-locked-loop-based control scheme for Lissajous-trajectory scanning of fast steering mirrors. ACC 2017: 1568-1573 - [c23]Ernst Csencsics
Parametric PID controller tuning for a fast steering mirror. CCTA 2017: 1673-1678 - [c22]Michael Steinegger, Martin Melik-Merkumians
Ontology-based framework for the generation of interlock code with redundancy elimination. ETFA 2017: 1-5 - [c21]Michael Steinegger, Martin Melik-Merkumians
A framework for automatic knowledge-based fault detection in industrial conveyor systems. ETFA 2017: 1-6 - 2016
- [j11]Rene Paris, Martin Melik-Merkumians
Probabilistic Absolute Position Sensor Based on Objective Laser Speckles. IEEE Trans. Instrum. Meas. 65(5): 1188-1196 (2016) - [c20]Ernst Csencsics
Design of a dual-tone controller for Lissajous-based scanning of fast steering mirrors. ACC 2016: 461-466 - [c19]Rudolf Saathof
Non-parametric robustness analysis for feedback motion control for a high precision stage with large mass uncertainty. ACC 2016: 2611-2616 - [c18]Dominik Kohl, Thomas Riel, Rudolf Saathof
Auto-tuning PI controller for surface tracking in atomic force microscopy - a practical approach. ACC 2016: 7396-7401 - [c17]Matthias Bibl, Michael Robin, Michael Steinegger, Georg Schitter
Framework for implementation of iterative learning control on programmable logic controllers. ETFA 2016: 1-4 - [c16]Martin Melik-Merkumians
A service-oriented domain specific language programming approach for batch processes. ETFA 2016: 1-9 - [c15]Michael Steinegger, Martin Melik-Merkumians
Automatic generation of diagnostic handling code for decentralized PLC-based control architectures. ETFA 2016: 1-8 - [c14]Michael Steinegger, Nikolaus Plaschka, Martin Melik-Merkumians
A framework for modular and distributable control of reconfigurable robotic systems. ICIT 2016: 848-853 - 2015
- [j10]Markus Thier, Rudolf Saathof, Ernst Csencsics, Reinhard Hainisch, Andreas Sinn, Georg Schitter:
Entwurf und Regelung eines Positioniersystems für robotergestützte Nanomesstechnik. Autom. 63(9): 727-738 (2015) - [j9]Georg Schitter
Mess-, Automatisierungs- und Robotertechnik. Elektrotech. Informationstechnik 132(4-5): 189-190 (2015) - [c13]Shingo Ito, Daniel Neyer, Stefan Pirker, Jürgen Steininger, Georg Schitter
Atomic force microscopy using voice coil actuators for vibration isolation. AIM 2015: 470-475 - [c12]Rene Paris, Martin Melik-Merkumians
Vision-based probabilistic absolute position sensor. I2MTC 2015: 2066-2071 - 2013
- [j8]Markus Thier, Rene Paris, Thomas Thurner
Low-Latency Shack-Hartmann Wavefront Sensor Based on an Industrial Smart Camera. IEEE Trans. Instrum. Meas. 62(5): 1241-1249 (2013) - [c11]Han Woong Yoo, Shingo Ito, Michel Verhaegen, Georg Schitter
Transformation-based iterative learning control for non-collocated sensing of a galvanometer scanner. ECC 2013: 1204-1209 - [c10]Michael Steinegger, Alois Zoitl
Design patterns for separating fault handling from control code in discrete manufacturing systems. IECON 2013: 4368-4373 - 2012
- [j7]Andreas Kugi
Automatisierungs- und Regelungstechnik. Elektrotech. Informationstechnik 129(1): 1-2 (2012) - [j6]Jürgen Steininger, Stefan Kuiper, Shingo Ito
Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration. Elektrotech. Informationstechnik 129(1): 28-33 (2012) - [j5]Rene Paris, Thomas Thurner
Intelligente Kameras in der Messtechnik. Elektrotech. Informationstechnik 129(1): 34-41 (2012) - 2011
- [j4]Hong Song, Rufus Fraanje, Georg Schitter
Controller Design for a High-Sampling-Rate Closed-Loop Adaptive Optics System with Piezo-Driven Deformable Mirror. Eur. J. Control 17(3): 290-301 (2011) - 2010
- [c9]Jan Roelf van Hulzen, Georg Schitter
Modal actuation for high bandwidth nano-positioning. ACC 2010: 6525-6530
2000 – 2009
- 2009
- [c8]Stefan Kuiper, Georg Schitter
Self-sensing actuation and damping of a piezoelectric tube scanner for atomic force microscopy. ECC 2009: 3887-3892 - [c7]Jan Roelf van Hulzen, Georg Schitter
Load dynamics in piezoelectric actuation. ECC 2009: 5009-5014 - 2008
- [c6]Georg Schitter
Field Programmable Analog Array (FPAA) based control of an Atomic Force Microscope. ACC 2008: 2690-2695 - [c5]Georg Schitter
Dual actuation for high-bandwidth nanopositioning. CDC 2008: 5176-5181 - 2007
- [j3]Georg Schitter
Design and Modeling of a High-Speed AFM-Scanner. IEEE Trans. Control. Syst. Technol. 15(5): 906-915 (2007) - [c4]Daniel Y. Abramovitch, Sean B. Andersson, Lucy Y. Pao, Georg Schitter
A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force Microscopes. ACC 2007: 3488-3502 - [c3]Georg Schitter
Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time. ACC 2007: 3503-3508 - 2006
- [c2]Georg Schitter
Design and modeling of a high-speed scanner for atomic force microscopy. ACC 2006 - 2005
- [j2]Andreas Stemmer, Georg Schitter
Control Strategies Towards Faster Quantitative Imaging in Atomic Force Microscopy. Eur. J. Control 11(4-5): 384-395 (2005) - 2004
- [j1]Georg Schitter
Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy. IEEE Trans. Control. Syst. Technol. 12(3): 449-454 (2004) - 2003
- [c1]Georg Schitter, Andreas Stemmer, Frank Allgöwer:
Robust 2 DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy. ACC 2003: 3720-3725
Coauthor Index
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