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"DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe ..."

Thomas Hackl, Mathias Poik, Georg Schitter (2022)

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DOI: 10.1109/I2MTC48687.2022.9806676

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Thomas Hackl, Mathias Poik, Georg Schitter:
DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy. I2MTC 2022: 1-5

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