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"A double-node-upset completely tolerant CMOS latch design with extremely ..."

Aibin Yan et al. (2022)

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DOI: 10.1016/J.VLSI.2022.04.008

access: closed

type: Journal Article

metadata version: 2022-07-28

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Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen:
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86: 22-29 (2022)

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