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"An Analog Circuit Fault Characterization Methodology."

Yvan Maidon, Thomas Zimmer, André Ivanov (2005)

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DOI: 10.1007/S10836-005-6142-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
  - journals/et/MaidonZI05
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Yvan Maidon, Thomas Zimmer, André Ivanov:
An Analog Circuit Fault Characterization Methodology. J. Electron. Test. 21(2): 127-134 (2005)

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