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"PGIREM: Reliability-Constrained IR Drop Minimization and Electromigration ..."

Sukanta Dey et al. (2018)

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DOI: 10.1109/ISVLSI.2018.00018

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/isvlsi/DeyDNT18
Sukanta Dey, Satyabrata Dash, Sukumar Nandi, Gaurav Trivedi:
PGIREM: Reliability-Constrained IR Drop Minimization and Electromigration Assessment of VLSI Power Grid Networks Using Cooperative Coevolution. ISVLSI 2018: 40-45

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