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"Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation."

F. Celeiro et al. (1996)

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DOI: 10.1109/TEST.1996.557119

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/CeleiroDFST96
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  persistent URL:
  - https://dblp.org/rec/conf/itc/CeleiroDFST96
F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira:
Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628

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