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"Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP ..."

Yasuharu Kohiyama et al. (2007)

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DOI: 10.1109/ATS.2007.111

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Yasuharu Kohiyama, C. P. Ravikumar, Yasuo Sato, Laung-Terng Wang, Yervant Zorian:
Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides. ATS 2007: 207

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