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Chen Wang 0014
Person information
- affiliation: Mentor Graphics Corporation, Wilsonville, OR, USA
- affiliation (PhD 2003): University of Iowa, Iowa City, IA, USA
Other persons with the same name
- Chen Wang — disambiguation page
- Chen Wang 0001
— Mayo Clinic, Rochester, MN, USA
- Chen Wang 0002
- Chen Wang 0003
- Chen Wang 0004
- Chen Wang 0005
- Chen Wang 0006
- Chen Wang 0007
- Chen Wang 0008
- Chen Wang 0009
- Chen Wang 0010 — Google, Inc., Mountain View, CA, USA (and 1 more)
- Chen Wang 0011
- Chen Wang 0012
- Chen Wang 0013
- Chen Wang 0015
- Chen Wang 0016
- Chen Wang 0017 — Southeast University, College of Software Engineering, Nanjing, China
- Chen Wang 0018
- Chen Wang 0019
- Chen Wang 0020 — IBM China Research Laboratory, Beijing, China
- Chen Wang 0021 — Xi'an Jiaotong University, School of Electronic and Information Engineering, China
- Chen Wang 0022 — Lanzhou University, School of Mathematics and Statistics, Gansu, China
- Chen Wang 0023
- Chen Wang 0024
- Chen Wang 0025
- Chen Wang 0026
- Chen Wang 0027
- Chen Wang 0028
- Chen Wang 0029 — University of Paris-Sud, Orsay, France
- Chen Wang 0030 — INSA, Rennes, France
- Chen Wang 0031 — Beihang University, Qingdao Research Institute, China
- Chen Wang 0032
- Chen Wang 0033
- Chen Wang 0034 — Centrum Wiskunde & Informatica, Amsterdam, The Netherlands
- Chen Wang 0035 — Fudan University, Department of Computing and Information Technology, Shanghai, China
- Chen Wang 0036 — Peking University, Institute of Computational Linguistics, Beijing, China
- Chen Wang 0037 — Peking University, College of Engineering, State Key Laboratory for turbulence and Complex Systems, Beijing, China
- Chen Wang 0038
- Chen Wang 0039
- Chen Wang 0040
- Chen Wang 0041
- Chen Wang 0042
- Chen Wang 0043
- Chen Wang 0044
- Chen Wang 0045
- Chen Wang 0046
- Chen Wang 0047
- Chen Wang 0048
- Chen Wang 0049
- Chen Wang 0050 — Cornell University, USA
- Chen Wang 0051 — Nankai University, Tianjin, China
- Chen Wang 0052
- Chen Wang 0053
- Chen Wang 0054
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2020 – today
- 2022
- [j6]Chong-Siao Ye
Efficient Test Compression Configuration Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2323-2336 (2022) - [c16]Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy:
Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. VTS 2022: 1-7 - 2020
- [j5]Yu Huang
Low Cost Hypercompression of Test Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2964-2975 (2020) - [c15]Fong-Jyun Tsai, Chong-Siao Ye
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. ITC 2020: 1-10
2010 – 2019
- 2019
- [c14]Naixing Wang, Chen Wang, Kun-Han Tsai, Wu-Tung Cheng, Xijiang Lin, Mark Kassab, Irith Pomeranz:
TEA: A Test Generation Algorithm for Designs with Timing Exceptions. ATS 2019: 19-24 - 2018
- [c13]Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang:
Hypercompression of Test Patterns. ITC 2018: 1-9 - 2017
- [j4]Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Trimodal Scan-Based Test Paradigm. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1112-1125 (2017) - 2015
- [j3]Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang:
Isometric Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(11): 1847-1859 (2015) - [c12]Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang:
TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. ATS 2015: 19-24 - 2014
- [c11]Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang:
Isometric test compression with low toggling activity. ITC 2014: 1-7 - 2013
- [c10]Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Chen Wang:
On the generation of compact test sets. ITC 2013: 1-10
2000 – 2009
- 2007
- [j2]Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer:
Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electron. Test. 23(1): 35-45 (2007) - 2006
- [c9]Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo:
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. ATS 2006: 139-146 - 2005
- [j1]Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy:
Finite memory test response compactors for embedded test applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(4): 622-634 (2005) - [c8]Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz:
Defect Aware Test Patterns. DATE 2005: 450-455 - [c7]Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang:
Convolutional compaction-driven diagnosis of scan failures. ETS 2005: 176-181 - [c6]Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz:
On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios. VLSI Design 2005: 59-64 - 2004
- [c5]Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski:
Fault Diagnosis in Designs with Convolutional Compactors. ITC 2004: 498-507 - 2003
- [c4]Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Jerzy Tyszer:
On Compacting Test Response Data Containing Unknown Values. ICCAD 2003: 855-862 - [c3]Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy:
Convolutional Compaction of Test Responses. ITC 2003: 745-754 - 2002
- [c2]Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski:
Conflict driven techniques for improving deterministic test pattern generation. ICCAD 2002: 87-93 - 2001
- [c1]Chen Wang, Irith Pomeranz, Sudhakar M. Reddy:
REDI: An Efficient Fault Oriented Procedure to Identify Redundant Faults in Combinational Logic Circuits. ICCAD 2001: 370-374
Coauthor Index
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