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Maoxiang Yi
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2020 – today
- 2024
- [j25]Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision. J. Electron. Test. 40(3): 405-415 (2024) - [j24]Hong Zhang, Huaguo Liang, Yue Wang, Danqing Li, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Multi-transition delay test for improving the coverage of cell internal defects. IEICE Electron. Express 21(15): 20240326 (2024) - [j23]Shihao Yang, Huaguo Liang, Rong Hu, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Lightweight Hybrid Entropy Source True Random Number Generator Based on Jitter and Metastability. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3513-3517 (2024) - 2023
- [j22]Yongxia Sheng, Huaguo Liang, Bao Fang, Cuiyun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Design of approximate Booth multipliers based on error compensation. Integr. 90: 183-189 (2023) - [j21]Liyu Jin, Maoxiang Yi, Yuan Xiao, Lifa Sun, Yingchun Lu, Huaguo Liang:
A dynamically reconfigurable entropy source circuit for high-throughput true random number generator. Microelectron. J. 133: 105690 (2023) - [j20]Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectron. J. 138: 105841 (2023) - [j19]Yingchun Lu, Yun Yang, Rong Hu, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang, Yuanming Ma, Tian Chen, Liang Yao:
High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator. ACM Trans. Reconfigurable Technol. Syst. 16(4): 64:1-64:23 (2023) - 2022
- [j18]Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang:
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. J. Electron. Test. 38(1): 63-76 (2022) - [j17]Chen Tian, Jianyong Lu, Liu Jun, Huaguo Liang, Yingchun Lu, Maoxiang Yi:
A reconfigurable test method based on LFSR for 3D stacking integrated circuits. Integr. 87: 82-89 (2022) - [j16]Liang Yao, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi, Yingchun Lu:
M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectron. J. 119: 105314 (2022) - [j15]Yanjie Wang, Huaguo Liang, Yuchuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A reconfigurable PUF structure with dual working modes based on entropy separation model. Microelectron. J. 124: 105445 (2022) - [j14]Jianguo Cui, Maoxiang Yi, Di Cao, Liang Yao, Xinyu Wang, Huaguo Liang, Zhengfeng Huang, Haochen Qi, Tianming Ni, Yingchun Lu:
Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1752-1756 (2022) - [c16]Liang Yao, Huaguo Liang, Hong Zhang, Tianming Ni, Maoxiang Yi, Yingchun Lu:
A Lightweight M_TRNG Design based on MUX Cell Entropy using Multiphase Sampling. AsianHOST 2022: 1-4 - 2021
- [j13]Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yongxia Sheng, Cuiyun Jiang, Zhengfeng Huang, Yingchun Lu:
Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr. 81: 17-24 (2021) - [j12]Yuan Zhang, Huaguo Liang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A high reliability physically unclonable function based on multiple tunable ring oscillator. Microelectron. J. 117: 105263 (2021) - [j11]Xinyu Wang, Huaguo Liang, Yanjie Wang, Liang Yao, Yang Guo, Maoxiang Yi, Zhengfeng Huang, Haochen Qi, Yingchun Lu:
High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure. IEEE Trans. Circuits Syst. I Regul. Pap. 68(2): 741-750 (2021) - [j10]Yingchun Lu, Xinyu Wang, Yanjie Wang, Yuan Zhang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Huaguo Liang:
Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1922-1929 (2021) - 2020
- [j9]Yingchun Lu, Huaguo Liang, Liang Yao, Xinyu Wang, Haochen Qi, Maoxiang Yi, Cuiyun Jiang, Zhengfeng Huang:
Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access 8: 108482-108490 (2020)
2010 – 2019
- 2019
- [j8]Maoxiang Yi, Jingchang Bian, Tianming Ni, Cuiyun Jiang, Hao Chang, Huaguo Liang:
A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(4): 755-766 (2019) - [j7]Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen:
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. Circuits Syst. II Express Briefs 66-II(2): 287-291 (2019) - [c15]Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan:
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. VTS 2019: 1-6 - 2018
- [c14]Gaoliang Ma, Huaguo Liang, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Kai Zhou:
A Low-Cost High-Efficiency True Random Number Generator on FPGAs. ATS 2018: 54-58 - [c13]Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tianming Ni, Yingchun Lu:
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. ATS 2018: 59-62 - [c12]Kai Zhou, Huaguo Liang, Yue Jiang, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yao Yao:
A High Reliability FPGA Chip Identification Generator Based on PDLs. ATS 2018: 63-67 - [c11]Aibin Yan, Yafei Ling, Kang Yang, Zhili Chen, Maoxiang Yi:
Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS. ATS 2018: 86-91 - [c10]Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo:
Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. ITC-Asia 2018: 49-54 - 2017
- [j6]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi:
A single event transient detector in SRAM-based FPGAs. IEICE Electron. Express 14(12): 20170210 (2017) - [j5]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xiangsheng Fang, Tianming Ni, Maoxiang Yi:
A highly reliable butterfly PUF in SRAM-based FPGAs. IEICE Electron. Express 14(14): 20170551 (2017) - [j4]Xin Cheng, Hongyu Liang, Longjie Du, Zhang Zhang, Maoxiang Yi, Guangjun Xie:
An Output-Capacitorless Ultra-Low Power Low-Dropout Regulator. J. Circuits Syst. Comput. 26(12): 1750193:1-1750193:11 (2017) - [j3]Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yiming Ouyang, Huaguo Liang:
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology. IEEE Trans. Very Large Scale Integr. Syst. 25(6): 1978-1982 (2017) - [c9]Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang:
HLDTL: High-performance, low-cost, and double node upset tolerant latch design. VTS 2017: 1-6 - 2016
- [c8]Maoxiang Yi, Xiaohong Liu, Qingwu Wu, Tianming Ni, Zhengfeng Huang, Huaguo Liang:
NBTI mitigation by M-IVC with input duty cycle and randomness constraints. EWDTS 2016: 1-5 - [c7]Maoxiang Yi, Yingxian Gan, Zhengfeng Huang, Huaguo Liang:
Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect. ISIC 2016: 1-5 - 2015
- [j2]Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi:
A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology. IEICE Trans. Electron. 98-C(12): 1171-1178 (2015) - [c6]Huaguo Liang, Yangyang Dai, Maoxiang Yi, Dawen Xu, Zhengfeng Huang:
MTTF-Aware Reliability Task Scheduling for Heterogeneous Multicore System. ICA3PP (2) 2015: 716-727 - [c5]Guimao Zhang, Maoxiang Yi, Yong Miao, Dawen Xu, Huaguo Liang:
NBTI-induced circuit aging optimization by protectability-aware gate replacement technique. LATS 2015: 1-4 - 2011
- [c4]Chunlei Mei, Maoxiang Yi, Zhifei Shen:
Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination. TrustCom 2011: 701-705 - 2010
- [j1]Maoxiang Yi, Huaguo Liang, Lei Zhang, Wenfa Zhan:
A Novel x -ploiting Strategy for Improving Performance of Test Data Compression. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 324-329 (2010)
2000 – 2009
- 2009
- [c3]Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang:
Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. CSE (2) 2009: 698-702 - 2008
- [c2]Maoxiang Yi, Huaguo Liang, Zhengfeng Huang:
Balancing wrapper chains of SoC core based on best interchange decreasing. SoC 2008: 1-4 - 2005
- [c1]Huaguo Liang, Maoxiang Yi, Xiangsheng Fang, Cuiyun Jiang:
A BIST Scheme Based on Selecting State Generation of Folding Counters. Asian Test Symposium 2005: 144-149
Coauthor Index
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last updated on 2024-11-28 20:26 CET by the dblp team
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