IEEE Design & Test of Computers, Volume 10

Volume 10, Number 1, January-March 1993

Conference Reports

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  Conference Reports. IEEE Des. Test Comput. 10(1): 2-3 (1993)

Book Review

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  Book Review. IEEE Des. Test Comput. 10(1): 4-5 (1993)

Theme Articles

• 
  Pinaki Mazumder, John P. Hayes:
  Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories. IEEE Des. Test Comput. 10(1): 6-7 (1993)
• 
  Ad J. van de Goor:
  Using March Tests to Test SRAMs. 8-14
• 
  Michihiro Inoue, Toshio Yamada, Atsushi Fujiwara:
  A New Testing Acceleration Chip for Low-Cost Memory Tests. 15-19

VLSI Design 92, Part 2

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  Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth:
  Generating Tests for Delay Faults in Nonscan Circuits. 20-28
• 
  Biswadip Mitra, Preeti Ranjan Panda, Parimal Pal Chaudhuri:
  Estimating the Complexity of Synthesized Designs from FSM Specifications. 30-35
• 
  B. Naveen, K. S. Raghunathan:
  An Automatic Netlist-to-Schematic Generator. 36-41

Also in this Issue

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  Peter C. Maxwell, Robert C. Aitken:
  Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. 42-51
• 
  William R. Simpson, John W. Sheppard:
  Fault Isolation in an Integrated Diagnostic Environment. 52-66
• 
  Karl R. Umstadter, Don L. Millard, Robert C. Block:
  Applications of a Laser-Induced Plasma Pathway to Testing of Electronic Modules. 67-72
• 
  Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja:
  A Tutorial on Built-in Self-Test. I. Principles. 73-82
• 
  A D&T Roundtable. IEEE Des. Test Comput. 10(1): 83-91 (1993)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 10(1): 92-93 (1993)

DATC Newsletter

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  DATC Newsletter. IEEE Des. Test Comput. 10(1): 94-95 (1993)

Volume 10, Number 2, April-June 1993

News

• 
  News. IEEE Des. Test Comput. 10(2): 2-3 (1993)

Conference Reports

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  Conference Reports. IEEE Des. Test Comput. 10(2): 4-5 (1993)

Multimegabit Memories, Part 2

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  Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima:
  Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. 6-12
• 
  Samir Naik, Frank Agricola, Wojciech Maly:
  Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. 13-23
• 
  Robert P. Treuer, Vinod K. Agarwal:
  Built-In Self-Diagnosis for Repairable Embedded RAMs. 24-33
• 
  Jos van Sas, Francky Catthoor, Hugo De Man:
  Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories. 34-44

Also in this Issue

• 
  Steve Vinoski:
  RISE++: A Symbolic Environment for Scan-Based Testing. 56-68
• 
  Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja:
  A Tutorial on Built-In Self-Test, Part 2: Applications. 69-77
• 
  John W. Sheppard, William R. Simpson:
  Performing Effective Fault Isolation in Integrated Diagnostics. 78-90

1994 Editorial Calendar

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  1994 Editorial Calendar. IEEE Des. Test Comput. 10(2): 55- (1993)

New Products

• 
  New Products. IEEE Des. Test Comput. 10(2): 91- (1993)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 10(2): 92-93 (1993)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 10(2): 94-95 (1993)

Volume 10, Number 3, July-September 1993

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 10(3): 2- (1993)

News

• 
  News. IEEE Des. Test Comput. 10(3): 4- (1993)

Theme Articles

• 
  Wayne H. Wolf:
  Guest Editor's Introduction: Hardware-Software Codesign. IEEE Des. Test Comput. 10(3): 5- (1993)
• 
  Donald E. Thomas, Jay K. Adams, Herman Schmit:
  A Model and Methodology for Hardware-Software Codesign. 6-15
• 
  Asawaree Kalavade, Edward A. Lee:
  A Hardware-Software Codesign Methodology for DSP Applications. 16-28
• 
  Rajesh K. Gupta, Giovanni De Micheli:
  Hardware-Software Cosynthesis for Digital Systems. 29-41
• 
  Maximo H. Salinas, Barry W. Johnson, James H. Aylor:
  Implementation-Independent Model of an Instruction Set Architecture in VHDL. 42-54
• 
  Asim Smailagic, Daniel P. Siewiorek:
  A Case Study in Embedded-System Design: The VuMan 2 Wearable Computer. 56-67

Also in this Issue

• 
  Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian:
  A Method for Consistent Fault Coverage Reporting. 68-79
• 
  A D&T Roundtable. IEEE Des. Test Comput. 10(3): 80-86 (1993)
• 
  Franc Brglez:
  A D&T Special Report on ACM/SIGDA Design Automation Benchmarks: Catalyst or Anathema? IEEE Des. Test Comput. 10(3): 87-91 (1993)

New Products

• 
  New Products. IEEE Des. Test Comput. 10(3): 92- (1993)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 10(3): 93- (1993)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 10(3): 94-95 (1993)

Volume 10, Number 4, October-December 1993

News

• 
  News. IEEE Des. Test Comput. 10(4): 4-5, 90-91 (1993)

Book Review

• 
  Book Review. IEEE Des. Test Comput. 10(4): 6, 96 (1993)

Theme Articles

• 
  Wayne Wei-Ming Dai, Kwang-Ting (Tim) Cheng:
  Guest Editor's Introduction. IEEE Des. Test Comput. 10(4): 7- (1993)
• 
  Robert C. Frye, King L. Tai, Maureen Y. Lau, Thaddeus J. Gabara:
  Trends in Silicon-On-Silicon Multichip Modules. 8-17
• 
  David Staepelaere, Jeffrey Jue, Tal Dayan, Wayne Wei-Ming Dai:
  SURF: Rubber-Band Routing System for Multichip Modules. 18-26
• 
  Jun Dong Cho, Majid Sarrafzadeh, Mysore Sriram, Sung-Mo Kang:
  High-Performance MCM Routing. 27-37
• 
  Ting-Ting Y. Lin, Huoy-Yu Liou:
  A New Framework for Designing: Built-in Test Multichip Modules with Pipelined Test Strategy. 38-51

Hardware-Software Codesign, Part 2

• 
  Hassan Rajaei, Rassul Ayani:
  Design Issues in Parallel Simulation Languages. 52-63
• 
  Rolf Ernst, Jörg Henkel, Thomas Benner:
  Hardware-Software Cosynthesis for Microcontrollers. 64-75

Also in this Issue

• 
  Fadi N. Sibai:
  A Fault-Tolerant Digital Artificial Neuron. 76-82
• 
  1993 Annual Index: Complete author and subject listing. IEEE Des. Test Comput. 10(4): 83-87 (1993)

New Products

• 
  New Products. IEEE Des. Test Comput. 10(4): 88-90 (1993)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 10(4): 92- (1993)

TTTC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 10(4): 93-95 (1993)