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"Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI ..."

Loris Duch et al. (2020)

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DOI: 10.1109/TVLSI.2020.3003471

access: closed

type: Journal Article

metadata version: 2021-09-20

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  - https://dblp.org/rec/journals/tvlsi/DuchQWLBCA20
Loris Duch, Miguel Peón Quirós, Pieter Weckx, Alexandre Levisse, Rubén Braojos, Francky Catthoor, David Atienza:
Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors. IEEE Trans. Very Large Scale Integr. Syst. 28(10): 2122-2133 (2020)

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