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"Analytical test buffer design for differential signaling I/O buffers by ..."

Sanghyeon Baeg, Sung Soo Chung (2005)

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DOI: 10.1109/TVLSI.2004.842899

access: closed

type: Journal Article

metadata version: 2020-03-11

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Sanghyeon Baeg, Sung Soo Chung:
Analytical test buffer design for differential signaling I/O buffers by error syndrome analysis. IEEE Trans. Very Large Scale Integr. Syst. 13(3): 370-383 (2005)

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