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"A mean field annealing approach to robust corner detection."

Kwanghoon Sohn, Jung H. Kim, Winser E. Alexander (1998)

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DOI: 10.1109/3477.658581

access: closed

type: Journal Article

metadata version: 2020-05-18

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  - journals/tsmc/SohnKA98
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Kwanghoon Sohn, Jung H. Kim, Winser E. Alexander:
A mean field annealing approach to robust corner detection. IEEE Trans. Syst. Man Cybern. Part B 28(1): 82-90 (1998)

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