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"A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in ..."

Jie Xiao et al. (2023)

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DOI: 10.1109/TR.2022.3197787

access: closed

type: Journal Article

metadata version: 2023-09-24

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Jie Xiao, Weidong Zhu, Qing Shen, Haixia Long, Jungang Lou:
A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits. IEEE Trans. Reliab. 72(3): 1078-1092 (2023)

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