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"A Microwave Time Domain Reflectometry Technique Combining the Wavelet ..."

Yi Xie et al. (2022)

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DOI: 10.1109/TIM.2022.3147865

access: closed

type: Journal Article

metadata version: 2022-03-16

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  - https://dblp.org/rec/journals/tim/XieYSHQ22
Yi Xie, Xiaoqing Yang, Piqiang Su, Yi He, Yunfeng Qiu:
A Microwave Time Domain Reflectometry Technique Combining the Wavelet Decomposition Analysis and Artificial Neural Network for Detection of Defects in Dielectric Structures. IEEE Trans. Instrum. Meas. 71: 1-11 (2022)

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