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"Design of Clocked Comparator Preventing Bit Errors to Improve Reliability ..."

Joo-Hyung Chae (2023)

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DOI: 10.1109/TIM.2023.3318687

access: closed

type: Journal Article

metadata version: 2023-10-27

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Joo-Hyung Chae:
Design of Clocked Comparator Preventing Bit Errors to Improve Reliability of Low-Speed DRAM Measurement. IEEE Trans. Instrum. Meas. 72: 1-10 (2023)

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