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"Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier."

Vivek Sangwan et al. (2020)

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DOI: 10.1109/TIE.2019.2931233

access: closed

type: Journal Article

metadata version: 2022-02-23

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  - https://dblp.org/rec/journals/tie/SangwanTKC20
Vivek Sangwan, Cher Ming Tan, Dipesh Kapoor, Hsien-Chin Chiu:
Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier. IEEE Trans. Ind. Electron. 67(7): 5708-5716 (2020)

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