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"Defect Detection of Pantograph Slide Based on Deep Learning and Image ..."

Xiukun Wei et al. (2020)

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DOI: 10.1109/TITS.2019.2900385

access: closed

type: Journal Article

metadata version: 2020-08-18

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Xiukun Wei, Siyang Jiang, Yan Li, Chenliang Li, Limin Jia, Yongguang Li:
Defect Detection of Pantograph Slide Based on Deep Learning and Image Processing Technology. IEEE Trans. Intell. Transp. Syst. 21(3): 947-958 (2020)

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