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"Loop Test System: A New Maintenance Feature for the Distributed Integrated ..."

James A. Clark, Bob Lee, Joseph L. Gargiulo (1981)

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DOI: 10.1109/TCOM.1981.1094896

access: closed

type: Journal Article

metadata version: 2020-09-01

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James A. Clark, Bob Lee, Joseph L. Gargiulo:
Loop Test System: A New Maintenance Feature for the Distributed Integrated Digital Network. IEEE Trans. Commun. 29(10): 1419-1428 (1981)

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