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"Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable ..."

Amir Zjajo et al. (2011)

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DOI: 10.1109/TCSI.2010.2055291

access: closed

type: Journal Article

metadata version: 2021-10-14

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Amir Zjajo, Qin Tang, Michel Berkelaar, José Pineda de Gyvez, Alessandro Di Bucchianico, Nick van der Meijs:
Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(1): 164-175 (2011)

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