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"Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to ..."

Sanghyeon Baeg, Shi-Jie Wen, Richard Wong (2010)

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DOI: 10.1109/TCSI.2009.2025856

access: closed

type: Journal Article

metadata version: 2020-05-22

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Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(4): 814-822 (2010)

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