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"A test methodology for wafer scale system."

David L. Landis (1992)

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DOI: 10.1109/43.108620

access: closed

type: Journal Article

metadata version: 2020-09-24

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David L. Landis:
A test methodology for wafer scale system. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 76-82 (1992)

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