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"Static electromigration analysis for on-chip signal interconnects."

David T. Blaauw et al. (2003)

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DOI: 10.1109/TCAD.2002.805728

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/BlaauwOZD03
David T. Blaauw, Chanhee Oh, Vladimir Zolotov, Aurobindo Dasgupta:
Static electromigration analysis for on-chip signal interconnects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(1): 39-48 (2003)

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